100Ω - 1kΩ

LP73

thin film resistance thermal chip sensor

applications and ratings (continued)

Resistance

Tolerance

T.C.R.

Tolerance

T.C.R.

(ppm/°C)

Max.

100Ω - 2kΩ

100Ω - 10kΩ

Resistance Range

E-24

1J

2A

2B

F: ±1%, G: ±2%

J: ±5%

F: ±1%

G: ±2%

J: ±5%

G: ±2%, J: ±5%

±5%

3000

100Ω-1kΩ

100Ω-300Ω

330Ω-1kΩ

3300

3600

4000

4500

5000

Performance Characteristics

Resistance

Within regulated

tolerance

T.C.R.

+25°C/+65°C

25°C

Within specified

T.C.R.

Overload

Rated voltage x 2.5 for 5 seconds

±0.5%

Resistance to Solder Heat

260°C ± 5°C, 10 seconds ± 1 second

Rapid Change

of Temperature

-55°C (30 minutes),+25°C (2-3 minutes), +125°C (30 minutes),

+25°C (2-3 minutes), 5 cycles

±0.5%

Endurance at 70°C

70°C ± 2°C, 1000 hours, 1.5 hours ON, 0.5 hours OFF cycle

Moisture Resistance

40°C ± 2°C, 90 - 95% RH, 1000 hours, 1.5 hours ON, 0.5 hours OFF cycle

±2.0%

Derating Curve

Temperature Characteristics

100

80

60

40

20

-60

-40

-20

0

406080100140

70

20

Ambient Temperature

(°C)

0

-55

120

125

60

30

0

-10

-50

-25

0

50

100

125

Ambient Temperature

(°C)

-40

-75

4000ppm/°C

20

10

-20

-30

3600ppm/°C

3300ppm/°C

3000ppm/°C

25

50

40

4500ppm/°C

5000ppm/°C

T.C.R.

(X10

75

Approximate Expression for Resistance-Temperature Characteristics

3000

3300

3600

0.931258

0.00265213

0.924355

0.916356

T.C.R.

0.00292569

0.00323714

(Values are not guaranteed but typical)

T: Ambient temperature (°C)

environmental applications

4000

4500

5000

0.907039

0.00361006

0.897412

0.886014

0.00395222

0.00437224

±0.5%

±2.0%

––

––

±0.3%

±0.3%

±1.5%

±0.3%

±1.5%

Parameter

Requirement ∆ R ±(%+0.05Ω)

Limit

Typical

Test Method

183

KOA Speer Electronics, Inc. • 199 Bolivar Drive • Bradford, PA 16701 • USA • 814-362-5536 • Fax: 814-362-8883 • www.koaspeer.com

Specifications given herein may be changed at any time without prior notice. Please confirm technical specifications before you order and/or use.

6/25/12

Confirming resistance drift is recommended since this product has a tendency to have bigger resistance change than general flat chip over 70°C.

Please pay attention not to be applied ESD, it may cause of resistance change.

Test Items

High Temperature Exposure

125°C, 1000 hours

±8.0%

Reference

Test Method

ESD

Human model, 100 pF 1.5 kΩ

500V

Actual Value (Out of Guarantee)