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ADM208EAR Datasheet(PDF) 11 Page - Analog Devices

Part No. ADM208EAR
Description  EMI/EMC Compliant, -15 kV ESD Protected, RS-232 Line Drivers/Receivers
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Maker  AD [Analog Devices]
Homepage  http://www.analog.com
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ADM206E/ADM207E/ADM208E/ADM211E/ADM213E
REV. B
–11–
R1
R2
C1
DEVICE
UNDER TEST
HIGH
VOLTAGE
GENERATOR
ESD TEST METHOD
R2
C1
H. BODY MIL-STD883B
1.5k
100pF
IEC1000-4-2
330
150pF
Figure 25. ESD Test Standards
100
90
36.8
10
tDL
tRL
TIME t
Figure 26. Human Body Model ESD Current Waveform
100
90
10
TIME t
30ns
60ns
0.1 TO 1ns
Figure 27. IEC1000-4-2 ESD Current Waveform
The ADM2xxE family of products are tested using both the
above mentioned test methods. All pins are tested with respect
to all other pins as per the MIL-STD-883B specification. In
addition all I-O pins are tested as per the IEC test specification.
The products were tested under the following conditions:
(a) Power-On—Normal Operation
(b) Power-On—Shutdown Mode
(c) Power-Off
There are four levels of compliance defined by IEC1000-4-2.
The ADM2xxE family of products meet the most stringent
compliance level for both contact and for air-gap discharge. This
means that the products are able to withstand contact discharges in
excess of 8 kV and air-gap discharges in excess of 15 kV.
Table IV. IEC1000-4-2 Compliance Levels
Contact Discharge
Air Discharge
Level
kV
kV
12
2
24
4
36
8
48
15
Table V. ADM2xxE ESD Test Results
ESD Test Method
I-O Pins
Other Pins
MIL-STD-883B
±15 kV
±2.5 kV
IEC1000-4-2
Contact
±8 kV
Air
±15 kV
FAST TRANSIENT BURST TESTING (IEC1000-4-4)
IEC1000-4-4 (previously 801-4) covers electrical fast-transient/
burst (EFT) immunity. Electrical fast transients occur as a
result of arcing contacts in switches and relays. The tests simu-
late the interference generated when for example a power relay
disconnects an inductive load. A spark is generated due to the
well known back EMF effect. In fact the spark consists of a
burst of sparks as the relay contacts separate. The voltage appear-
ing on the line, therefore, consists of a bust of extremely fast tran-
sient impulses. A similar effect occurs when switching on
fluorescent lights.
The fast transient burst test defined in IEC1000-4-4 simulates
this arcing and its waveform is illustrated in Figure 28. It con-
sists of a burst of 2.5 kHz to 5 kHz transients repeating at
300 ms intervals. It is specified for both power and data lines.
300ms
15ms
t
V
5ns
0.2/0.4ms
50ns
V
t
Figure 28. IEC1000-4-4 Fast Transient Waveform




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