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BQ294702DSGR Datasheet(PDF) 11 Page - Texas Instruments |
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BQ294702DSGR Datasheet(HTML) 11 Page - Texas Instruments |
11 / 19 page OUT VDD VSS 1 3 2 6 4 5 I IN4 I IN3 I IN2 I DD V3 V1 V2 7 8 V4 I IN1 CD I CELL I CELL = IDD + IIN1 + I IN2 + IIN3 + I IN4 V(OUT) V(VCELL) OV Condition ≤ 170 ms V(CD) CD pin held low bq294700, bq294701, bq294702 bq294703, bq294704, bq294705 www.ti.com SLUSB15 – SEPTEMBER 2012 CUSTOMER TEST MODE It is possible to reduce test time for checking the overvoltage function by simply shorting the external CD capacitor to VSS. In this case, the OV delay would be reduced to the t(CD_GND) value, which has a maximum of 170 ms. Figure 13 shows the timing for the Customer Test Mode. Figure 13. Timing for Customer Test Mode Figure 14 shows the measurement for current consumption of the product for both VDD and Vx. Figure 14. Configuration for IC Current Consumption Test Copyright © 2012, Texas Instruments Incorporated Submit Documentation Feedback 11 Product Folder Links: bq294700 bq294701 bq294702 bq294703 bq294704 bq294705 |
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