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ACT-F128K32N-070P7C Datasheet(PDF) 2 Page - Aeroflex Circuit Technology

Part # ACT-F128K32N-070P7C
Description  ACT-F128K32 High Speed 4 Megabit FLASH Multichip Module
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Manufacturer  AEROFLEX [Aeroflex Circuit Technology]
Direct Link  http://www.aeroflex.com
Logo AEROFLEX - Aeroflex Circuit Technology

ACT-F128K32N-070P7C Datasheet(HTML) 2 Page - Aeroflex Circuit Technology

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Aeroflex Circuit Technology
SCD1667 REV A 4/28/97 Plainview NY (516) 694-6700
2
sealed co-fired ceramic 66 pin, 1.08" sq
PGA or a 68 lead, .88" sq Ceramic Gull
Wing CQFP package for operation over the
temperature range of -55°C to +125°C and
military environment.
Each flash memory die is organized as
128KX8
bits
and
is
designed
to
be
programmed in-system with the standard
system 5.0V Vcc supply. A 12.0V VPP is
not required for write or erase operations.
The MCM can also be reprogrammed with
standard EPROM programmers (with the
proper socket).
The
standard
ACT-F128K32
offers
access times between 60ns and 150ns,
allowing
operation
of
high-speed
microprocessors without wait states. To
eliminate bus contention, the device has
separate chip enable (CE) and write enable
(WE). The ACT-F128K32 is command set
compatible with JEDEC standard 1 Mbit
EEPROMs. Commands are written to the
command
register
using
standard
microprocessor
write
timings.
Register
contents serve as input to an internal
state-machine which controls the erase and
programming circuitry. Write cycles also
internally latch addresses and data needed
for the programming and erase operations.
Reading data out of the device is similar
to reading from 12.0V Flash or EPROM
devices. The ACT-F128K32 is programmed
by
executing
the
program
command
sequence. This will invoke the Embedded
Program Algorithm which is an internal
algorithm
that
automatically
times
the
program pulse widths and verifies proper
cell margin. Typically, each sector can be
programmed and verified in less than 0.3
second.
Erase
is
accomplished
by
executing the erase command sequence.
This will invoke the Embedded Erase
Algorithm which is an internal algorithm
that automatically preprograms the array, (if
it is not already programmed before)
executing
the
erase
operation.
During
erase, the device automatically times the
erase pulse widths and verifies proper cell
margin.
Each die in the module or any individual
sector of the die is typically erased and
verified
in
1.3
seconds
(if
already
completely preprogrammed).
Each die also features a sector erase
architecture. The sector mode allows for
16K byte blocks of memory to be erased
and reprogrammed without affecting other
blocks. The ACT-F128K32 is erased when
shipped from the factory.
The device features single 5.0V power
supply operation for both read and write
functions.
lnternally
generated
and
regulated voltages are provided for the
program and erase operations. A low VCC
detector
automatically
inhibits
write
operations on the loss of power. The end of
program or erase is detected by Data
Polling of D7 or by the Toggle Bit feature on
D6. Once the end of a program or erase
cycle has been completed,-+ the device
internally resets to the read mode.
All bits of each die, or all bits within a
sector
of
a
die,
are
erased
via
Fowler-Nordhiem
tunneling.
Bytes
are
programmed one byte at a time by hot
electron injection.
DESC Standard Military Drawing (SMD)
numbers are released.
General Description, Cont’d,


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