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EVAL-AD5535BEBZ Datasheet(PDF) 11 Page - Analog Devices |
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EVAL-AD5535BEBZ Datasheet(HTML) 11 Page - Analog Devices |
11 / 16 page Data Sheet AD5535B Rev. A | Page 11 of 16 TERMINOLOGY Integral Nonlinearity (INL) A measure of the maximum deviation from a straight line passing through the endpoints of the DAC transfer function. It is expressed as a percentage of full-scale range. Differential Nonlinearity (DNL) The difference between the measured change and the ideal 1 LSB change between any two adjacent codes. A specified DNL of ±1 LSB maximum ensures monotonicity. Zero Code Voltage A measure of the output voltage present at the device output with all 0s loaded to the DAC. It includes the offset of the DAC and the output amplifier and is expressed in V. Offset Error Calculated by taking two points in the linear region of the transfer function, drawing a line through these points, and extrapolating back to the y-axis. It is expressed in V. Voltage Gain Calculated from the change in output voltage for a change in code, multiplied by 16,384, and divided by the REF_IN voltage. This is calculated between two points in the linear section of the transfer function. Gain Error A measure of the output error with all 1s loaded to the DAC, and the difference between the ideal and actual analog output range. Ideally, the output should be 50 × REF_IN. It is expressed as a percentage of full-scale range. DC Power Supply Rejection Ratio (PSRR) A measure of the change in analog output for a change in VPP supply voltage. It is expressed in dB, and VPP is varied ±5%. DC Crosstalk The dc change in the output level of one DAC at midscale in response to a full-scale code change (all 0s to all 1s and vice versa) and the output change of all other DACs. It is expressed in LSB. Output Voltage Settling Time The time taken from when the last data bit is clocked into the DAC until the output has settled to within ±0.5 LSB of its final value. Measured for a step change of ¼ to ¾ full scale. Digital-to-Analog Glitch Impulse The area of the glitch injected into the analog output when the code in the DAC register changes state. It is specified as the area of the glitch in nV-sec when the digital code is changed by 1 LSB at the major carry transition (011 . . . 11 to 100 . . . 00 or 100 . . . 00 to 011 . . . 11). Analog Crosstalk The area of the glitch transferred to the output (VOUT) of one DAC due to a full-scale change in the output (VOUT) of another DAC. The area of the glitch is expressed in nV-sec. Digital Feedthrough A measure of the impulse injected into the analog outputs from the digital control inputs when the part is not being written to (SYNC is high). It is specified in nV-sec and measured with a worst-case change on the digital input pins, for example, from all 0s to all 1s and vice versa. Output Noise Spectral Density A measure of internally generated random noise. Random noise is characterized as a spectral density (voltage per √Hz). It is measured by loading all DACs to midscale and measuring noise at the output. It is measured in μV/√Hz. |
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