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YGUR302TM Datasheet(PDF) 7 Page - Seoul Semiconductor |
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YGUR302TM Datasheet(HTML) 7 Page - Seoul Semiconductor |
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7 / 13 page  서식번호 : SSC- QP- 7- 07- 25 (Rev.0.0) Rev. 02 Rev. 02 January 2012 January 2012 WWW.SEOULSEMICON.COM WWW.SEOULSEMICON.COM 5. Reliability Test 0/22 1 time 85 ℃, 85% 24hrs Reflow 3 times (Max 260 ℃ 10sec) Thermal shock 30 cycle Thermal resistance Test 0/22 500 hrs 20mA, @60 ℃,90% Operating at High temperature / High humidity 0/22 500 hrs 20mA, @85 ℃ Operating at High temperature 0/22 100 cycle -40~85 ℃ Shift (2hr/cycle) Thermal shock test 0/22 500 hrs 20mA, @25 ℃ Operating at Room temperature Number Of Damaged Duration / Cycle Test Conditions Item *Criterion Initial value ± 0.1V V F > Initial value * 0.5 Iv OK MSL : 2a (30 ℃, 60% : 4 weeks) |
Similar Part No. - YGUR302TM_12 |
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Similar Description - YGUR302TM_12 |
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