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XC7SH08 Datasheet(PDF) 6 Page - NXP Semiconductors |
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XC7SH08 Datasheet(HTML) 6 Page - NXP Semiconductors |
6 / 11 page XC7SH08_1 © NXP B.V. 2009. All rights reserved. Product data sheet Rev. 01 — 1 September 2009 6 of 11 NXP Semiconductors XC7SH08 2-input AND gate 12. Waveforms Measurement points are given in Table 9. Fig 5. Input (A and B) to output (Y) propagation delays mna116 A, B input Y output tPHL tPLH VM VM Table 9. Measurement point Type Input Output VI VM VM XC7SH08 GND to VCC 0.5 × VCC 0.5 × VCC Test data is given in Table 10. Definitions for test circuit: CL = Load capacitance including jig and probe capacitance. RT = Termination resistance should be equal to output impedance Zo of the pulse generator. Fig 6. Load circuitry for switching times mna101 VCC VI VO RT CL PULSE GENERATOR DUT Table 10. Test data Type Input Load Test VI tr, tf CL XC7SH08 VCC ≤ 3.0 ns 15 pF, 50 pF tPLH, tPHL |
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