PMEG3050BEP_1

© NXP B.V. 2009. All rights reserved.

Product data sheet

Rev. 01 — 28 October 2009

9 of 13

NXP Semiconductors

PMEG3050BEP

8.

Test information

The current ratings for the typical waveforms as shown in Figure 9, 10, 11 and 12 are

calculated according to the equations:

at DC, and

8.1 Quality information

This product has been qualified in accordance with the Automotive Electronics Council

(AEC) standard

Q101 - Stress test qualification for discrete semiconductors, and is

suitable for use in automotive applications.

9.

Package outline

Fig 13. Duty cycle definition

P

t

006aaa812

duty cycle

δ =

I

FAV

()

I

M

δ

×

=

I

RMS

I

FAV

()

=

I

RMS

I

M

δ

×

=

Fig 14. Package outline SOD128

07-09-12

Dimensions in mm

1.1

0.9

0.22

0.10

0.6

0.3

5.0

4.4

4.0

3.6

1.9

1.6

2.7

2.3

1

2