MOC3081 MOC3082 MOC3083

3

Motorola Optoelectronics Device Data

5

1

PWin, LED TRIGGER PULSE WIDTH (µs)

10

15

20

25

2

5

20

10

50

0

NORMALIZED TO:

PWin q 100 µs

TA, AMBIENT TEMPERATURE (°C)

–40

+400

Vdc

PULSE

INPUT

MERCURY

WETTED

RELAY

RTEST

CTEST

10 k

Ω

X100

SCOPE

PROBE

D.U.T.

APPLIED VOLTAGE

WAVEFORM

252 V

0 VOLTS

tRC

Vmax = 400 V

dv dt

+

0.63 Vmax

tRC

+ 504

tRC

1. The mercury wetted relay provides a high speed repeated pulse

to the D.U.T.

2. 100x scope probes are used, to allow high speeds and voltages.

3. The worst–case condition for static dv/dt is established by

triggering the D.U.T. with a normal LED input current, then

removing the current. The variable RTEST allows the dv/dt to be

gradually increased until the D.U.T. continues to trigger in

response to the applied voltage pulse, even after the LED

current has been removed. The dv/dt is then decreased until the

D.U.T. stops triggering.

tRC is measured at this point and

recorded.

5

–40

TA, AMBIENT TEMPERATURE (°C)

–20

0

20

40

60

80

100

10

20

50

100

200

500

0.6

TA, AMBIENT TEMPERATURE (°C)

IF = RATED IFT

0.7

0.8

0.9

1

1.1

1.2

1.3

1.4

1.5

–20

0

20

40

60

80

100

0.7

0.8

0.9

1

1.1

1.2

1.3

1.4

1.5

NORMALIZED TO

TA = 25°C

–20

0

20

40

60

80

100

VDRM = 800 V

Figure 3. Leakage with LED Off

versus Temperature

Figure 4. IDRM2, Leakage in Inhibit State

versus Temperature

Figure 5. Trigger Current versus Temperature

Figure 6. LED Current Required to Trigger

versus LED Pulse Width

Figure 7. Static dv/dt Test Circuit

100

–40