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6N137F Datasheet(PDF) 4 Page - Toshiba Semiconductor |
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6N137F Datasheet(HTML) 4 Page - Toshiba Semiconductor |
4 / 8 page 6N137 2007-10-01 4 Switching Characteristics (Ta = 25°C, VCC = 5V) Characteristic Symbol Test Circuit Test Condition Min. Typ. Max. Unit Propagation delay time to high output level tpLH 1 RL=350Ω, CL=15pF IF=7.5mA ― 60 75 ns Propagation delay time to low output level tpHL 1 RL=350Ω, CL=15pF IF=7.5mA ― 60 75 ns Output rise −fall time (10 −90%) tr, tf ― RL=350Ω, CL=15pF IF=7.5mA ― 30 ― ns Propagation delay time of enable from VEH to VEL tELH 2 RL=350Ω, CL=15pF IF=7.5mA VEH=3.0V VEL=0.5V ― 25 ― ns Propagation delay time of enable from VEL to VEH tEHL 2 RL=350Ω, CL=15pF IF=7.5mA VEH=3.0V VEL=0.5V ― 25 ― ns Common mode transient immunity at logic high output level CMH 3 VCM=10V RL=350Ω VO(min.)=2V IF=0mA ― 200 ― V / μs Common mode transient Immunity at logic low output level CML 3 VCM=10V RL=350Ω VO(max.)=0.8V IF=5mA ― −500 ― V / μs |
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