INA210, INA211

INA212, INA213

INA214

SBOS437D – MAY 2008 – REVISED NOVEMBER 2012

www.ti.com

This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with

appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more

susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.

PACKAGE

PACKAGE

PRODUCT

GAIN

PACKAGE

DESIGNATOR

MARKING

200V/V

SC70-6

DCK

CET

INA210A

200V/V

Thin QFN-10

RSW

KNJ

200V/V

SC70-6

DCK

SED

INA210B

200V/V

Thin QFN-10

RSW

SHQ

INA211A

500V/V

SC70-6

DCK

CEU

INA211B

500V/V

SC70-6

DCK

SEC

INA212A

1000V/V

SC70-6

DCK

CEV

INA212B

1000V/V

SC70-6

DCK

SEC

50V/V

SC70-6

DCK

CFT

INA213A

50V/V

Thin QFN-10

RSW

KPJ

50V/V

SC70-6

DCK

SEF

INA213B

50V/V

Thin QFN-10

RSW

SHT

100V/V

SC70-6

DCK

CFV

INA214A

100V/V

Thin QFN-10

RSW

KRJ

100V/V

SC70-6

DCK

SEA

INA214B

100V/V

Thin QFN-10

RSW

SHU

(1)

For the most current package and ordering information, see the Package Option Addendum located at the end of this data sheet, or

refer to our web site at www.ti.com.

ABSOLUTE MAXIMUM RATINGS

(1)

Over operating free-air temperature range, unless otherwise noted.

INA210, INA211,

INA212, INA213, INA214

UNIT

Supply Voltage

+26

V

–26 to +26

V

Analog Inputs,

(2)

GND–0.3 to +26

V

REF Input

GND–0.3 to (V+) + 0.3

V

GND–0.3 to (V+) + 0.3

V

5

mA

Operating Temperature

–55 to +150

°C

Storage Temperature

–65 to +150

°C

Junction Temperature

+150

°C

Human Body Model (HBM)

4000

V

ESD Ratings

Charged-Device Model (CDM)

1000

V

(version A):

Machine Model (MM)

200

V

Human Body Model (HBM)

1500

V

ESD Ratings

Charged-Device Model (CDM)

1000

V

(version B):

Machine Model (MM)

100

V

(1)

Stresses above these ratings may cause permanent damage. Exposure to absolute maximum conditions for extended periods may

degrade device reliability. These are stress ratings only, and functional operation of the device at these or any other conditions beyond

those specified is not implied.

(2)

(3)

Input voltage at any pin may exceed the voltage shown if the current at that pin is limited to 5mA.

2

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