PI3B3125QE datasheet(3/6 Pages) PERICOM

Part #	PI3B3125QE

Description	3.3V, 4-Bit, 2-Port Nanoswitch

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Manufacturer	PERICOM [Pericom Semiconductor Corporation]

Direct Link	http://www.pericom.com

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3 / 6 page

PI3B3125/PI3B3126

3.3V, 4-Bit, 2-Port NanoSwitch™

w/Individual Enables

3

PS8153F

09/09/04

Capacitance (TA = 25°C, f = 1 MHz)

Parameters(4)

Description

Test Conditions

Typ.

Units

CIN

Input Capacitance

VIN = 0V

3.5

pF

COFF

A/B Capacitance, Switch Off

8

Power Supply Characteristics

Parameters

Description

Test Conditions(1)

Min. Typ.(2) Max.

Units

ICC

Quiescent Power Supply Current

VCC = Max. VIN = GND or VCC

0.1

3

µA

ΔICC

Supply Current per Input HIGH

VCC = Max. VIN = 3.0V(3)

750

DC Electrical Characteristics (Over the Operating Range, TA = –40°C to +85°C, VCC = 3.3V ±10%)

Parameters

Description

Test Conditions(1)

Min.

Typ.(2) Max. Units

VIH

Input HIGH Voltage

Guaranteed Logic HIGH Level

2.0

V

VIL

Input LOW Voltage

Guaranteed Logic LOW Level

–0.5

0.8

IIH

Input HIGH Current

VCC = Max., VIN = VCC

±1

µA

IIL

Input LOW Current

VCC = Max., VIN = GND

±1

IOFF

Off Current

VCC = 0, VOUT = 3 to 3.6V

10

VIK

Clamp Diode Voltage

VCC = Min., IIN = –18mA

–1.2

V

RON

Switch On-Resistance(3)

VCC = Min., VIN = 0.0V, ION = 48mA or 60mA

5

8

Ω

VCC = Min., VIN = 2.4V, ION = 15mA

10

17

Notes:

1.

For Max. or Min. conditions, use appropriate value specified under Electrical Characteristics for the applicable device.

2.

Typical values are at VCC = 3.3V, +25°C ambient.

3.

Per driven input (control inputs only); A and B pins do not contribute to ICC.

Notes:

1. For Max. or Min. conditions, use appropriate value specified under Electrical Characteristics for the applicable device type.

2. Typical values are at VCC = 3.3V, TA = 25°C ambient and maximum loading.

3. Measured by the voltage drop between A and B pin at indicated current through the switch. On-Resistance is determined by the lower of the

voltages on the two (A, B) pins.

4. This parameter is determined by device characterization but is not production tested.

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