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CY14V256LA Datasheet(PDF) 10 Page - Cypress Semiconductor

Part # CY14V256LA
Description  256-Kbit (32 K x 8) nvSRAM
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Manufacturer  CYPRESS [Cypress Semiconductor]
Direct Link  http://www.cypress.com
Logo CYPRESS - Cypress Semiconductor

CY14V256LA Datasheet(HTML) 10 Page - Cypress Semiconductor

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CY14V256LA
Document Number: 001-76295 Rev. *B
Page 10 of 22
AC Switching Characteristics
Over the Operating Range
Parameters [9]
Description
35 ns
Unit
Cypress
Parameters
Alt
Parameters
Min
Max
SRAM Read Cycle
tACE
tACS
Chip enable access time
35
ns
tRC
[10]
tRC
Read cycle time
35
ns
tAA
[11]
tAA
Address access time
35
ns
tDOE
tOE
Output enable to data valid
15
ns
tOHA
[11]
tOH
Output hold after address change
3
ns
tLZCE
[12, 13]
tLZ
Chip enable to output active
3
ns
tHZCE
[12, 13]
tHZ
Chip disable to output inactive
13
ns
tLZOE
[12, 13]
tOLZ
Output enable to output active
0
ns
tHZOE
[12, 13]
tOHZ
Output disable to output inactive
13
ns
tPU
[12]
tPA
Chip enable to power active
0
ns
tPD
[12]
tPS
Chip disable to power standby
35
ns
SRAM Write Cycle
tWC
tWC
Write cycle time
35
ns
tPWE
tWP
Write pulse width
25
ns
tSCE
tCW
Chip enable to end of write
25
ns
tSD
tDW
Data setup to end of write
12
ns
tHD
tDH
Data hold after end of write
0
ns
tAW
tAW
Address setup to end of write
25
ns
tSA
tAS
Address setup to start of write
0
ns
tHA
tWR
Address hold after end of write
0
ns
tHZWE
[12, 13, 14] tWZ
Write enable to output disable
13
ns
tLZWE
[12, 13]
tOW
Output active after end of write
3
ns
Notes
9. Test conditions assume signal transition time of 1.8 ns or less, timing reference levels of VCCQ/2, input pulse levels of 0 to VCC Q(typ), and output loading of the specified
IOL/IOH and load capacitance shown in Figure 3 on page 9.
10. WE must be HIGH during SRAM read cycles.
11. Device is continuously selected with CE and OE LOW.
12. These parameters are guaranteed by design and are not tested.
13. Measured ±200 mV from steady state output voltage.
14. If WE is low when CE goes low, the outputs remain in the high-impedance state.


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