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SP483EEN-L Datasheet(PDF) 9 Page - Exar Corporation |
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SP483EEN-L Datasheet(HTML) 9 Page - Exar Corporation |
9 / 12 page 9 Exar Corporation 48720 Kato Road, Fremont CA, 94538 • 50-668-707 • www.exar.com SP483E_00_02092 With the Air Discharge Method, an ESD voltage is applied to the equipment under test (EUT) through air. This simulates an electrically charged person ready to connect a cable onto the rear of the system only to findanunpleasantzapjustbeforetheperson touches the back panel. The high energy potential on the person discharges through an arcing path to the rear panel of the system before he or she even touches the system. This energy, whether discharged directly or throughair,ispredominantlyafunctionofthe discharge current rather than the discharge voltage. Variableswithanairdischargesuch as approach speed of the object carrying the ESD potential to the system and humidity will tend to change the discharge current. For example, the rise time of the discharge current varies with the approach speed. The Contact Discharge Method applies the ESDcurrentdirectlytotheEUT. Thismethod was devised to reduce the unpredictability of the ESD arc. The discharge current rise time is constant since the energy is directly transferred without the air-gap arc. In situ- ations such as hand held systems, the ESD charge can be directly discharged to the equipment from a person already holding the equipment. The current is transferred on to the keypad or the serial port of the equipment directly and then travels through the PCB and finally to the IC. The circuit model in Figures 9 and 10 repre- sent the typical ESD testing circuit used for all three methods. The C S is initially charged with the DC power supply when the first switch (SW1) is on. Now that the capacitor is charged, the second switch (SW2) is on while SW1 switches off. t = 0ns t = 30ns 0A 15A 30A t → Figure 11. ESD Test Waveform for IEC61000-4-2 The voltage stored in the capacitor is then applied through R S, the current limiting resistor, onto the device under test (DUT). In ESD tests, the SW2 switch is pulsed so that the device under test receives a dura- tion of voltage. For the Human Body Model, the current limitingresistor(R S) and the source capacitor (C S) are 1.5kΩ an 100pF, respectively. For IEC-61000-4-2, the current limiting resistor (R S) and the source capacitor (CS) are 330Ω an 150pF, respectively. The higher C S value and lower RS value in the IEC61000-4-2 model are more stringent than the Human Body Model. The larger storage capacitor injects a higher voltage to the test point when SW2 is switched on. The lower current limiting resistor increases the current charge onto the test point. DEVICE PIN TESTED HUMAN BODY MODEL IEC6000-4-2 Air Discharge Direct Contact Level Driver Outputs Receiver Inputs +/-5kV +/-5kV +/-5kV +/-5kV +/-8kV +/-8kV 4 4 Table 1. Transceiver ESD Tolerance levels |
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