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ADS62P28 Datasheet(PDF) 8 Page - Texas Instruments

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Part # ADS62P28
Description  Dual-Channel, 11-Bit, 250-MSPS ADC With DDR LVDS and Parallel CMOS Outputs
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Manufacturer  TI [Texas Instruments]
Direct Link  http://www.ti.com
Logo TI - Texas Instruments

ADS62P28 Datasheet(HTML) 8 Page - Texas Instruments

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ADS62P19
SLAS937 – APRIL 2013
www.ti.com
TIMING REQUIREMENTS: LVDS AND CMOS MODES
(1)
(continued)
Typical values are at TA = +25°C, AVDD = 3.3 V, DRVDD = 1.8 V, sampling frequency = 250 MSPS, sine-wave input clock,
1.5-VPP clock amplitude, CLOAD = 5 pF
(2), and R
LOAD = 100 Ω
(3), unless otherwise noted. Minimum and maximum values are
across the full temperature range of TMIN = –40°C to TMAX = +85°C, AVDD = 3.3 V, and DRVDD = 1.7 V to 1.9 V.
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
PARALLEL CMOS MODE(7) (At fS = 210 MSPS)
tSTART
Input clock to data delay
Input clock falling edge crossover to start of data valid(8)
2.5
ns
tDV
Data valid time
Time interval of valid data(8)
1.7
2.7
ns
tPDI
Input clock falling edge crossover to output clock rising edge
tPDI = 0.28 × tS + tdelay
crossover
Clock propagation delay
100 MSPS ≤ sampling frequency ≤ 150 MSPS
tdelay
5.5
7.0
8.5
ns
tS = 1 / sampling frequency
Output clock duty cycle , CLKOUT
Output clock duty cycle
43%
100 MSPS ≤ sampling frequency ≤ 150 MSPS
Rise time measured from 20% to 80% of DRVDD
tRISE,
Data rise time,
Fall time measured from 80% to 20% of DRVDD
1.2
ns
tFALL
Data fall time
1 ≤ sampling frequency ≤ 210 MSPS
Rise time measured from 20% to 80% of DRVDD
tCLKRISE,
Output clock rise time,
Fall time measured from 80% to 20% of DRVDD
0.8
ns
tCLKFALL
Output clock fall time
1 ≤ sampling frequency ≤ 150 MSPS
Output buffer enable (OE)
tOE
Time to valid data after output buffer becomes active
100
ns
to data delay(9)
(7)
For fS > 150 MSPS, TI recommends using an external clock for data capture instead of the device output clock signal (CLKOUT).
(8)
Data valid refers to a logic high of 1.26 V and a logic low of 0.54 V.
(9)
The output buffer enable is controlled by serial interface register 40h. The output buffer becomes active when serial control data for the
output buffer are latched on the 16th SCLK falling edge when SEN is low.
Table 2. LVDS Timings at Lower Sampling Frequencies
SETUP TIME (ns)
HOLD TIME (ns)
tPDI (ns)
SAMPLING FREQUENCY (MSPS)
MIN
TYP
MAX
MIN
TYP
MAX
MIN
TYP
MAX
210
0.75
1.1
0.75
1.15
7.5
9
10.5
185
0.9
1.25
0.85
1.25
7.9
9.4
10.9
153
1.15
1.55
1.1
1.5
8.7
10.2
11.7
125
1.6
2
1.45
1.85
9.7
11.2
12.7
< 80
2
2
(enable low-speed mode for fS ≤ 80)
(1)
1
≤ fS ≤ 80
12.6
(enable low-speed mode for fS ≤ 80)
(1)
(1)
Low-speed mode can only be enabled with the serial interface configuration.
Table 3. CMOS Timings at Lower Sampling Frequencies with Respect to Input Clock
TIMINGS SPECIFIED WITH RESPECT TO INPUT CLOCK
SAMPLING FREQUENCY (MSPS)
tSTART (ns)
DATA VALID TIME (ns)
MIN
TYP
MAX
MIN
TYP
MAX
210
2.5
1.7
2.7
190
1.9
2
3
170
0.9
2.7
3.7
150
6
3.6
4.6
8
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Copyright © 2013, Texas Instruments Incorporated
Product Folder Links: ADS62P19


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