OPA1S2384

OPA1S2385

SBOS645A – DECEMBER 2012 – REVISED JUNE 2013

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This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with

appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more

susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.

SPECIFIED

PACKAGE

TEMPERATURE

PACKAGE

PRODUCT

PACKAGE-LEAD

DESIGNATOR

RANGE

MARKING

ORDERING NUMBER

OPA1S2384IDRCT

OPA1S2384

SON-10

DRC

–40°C to +85°C

OVAQ

OPA1S2384IDRCR

OPA1S2385IDRCT

OPA1S2385

SON-10

DRC

–40°C to +85°C

OUZQ

OPA1S2385IDRCR

(1)

For the most current package and ordering information see the Package Option Addendum at the end of this document, or see the

product folder at www.ti.com.

ABSOLUTE MAXIMUM RATINGS

(1)

Over operating free-air temperature range (unless otherwise noted).

OPA1S238x

UNIT

Supply voltage, V+ to V–

6

V

(V–) – 0.3 to (V+) + 0.3

V

Signal input terminals, op amp

section

±10

mA

±20

mA

Continuous

Digital input voltage range (SC pin)

–0.3 to +6

V

Digital input clamp current (SC pin)

–50

mA

–40 to +125

°C

–65 to +150

°C

+150

°C

Human body model (HBM)

4000

V

Electrostatic discharge (ESD)

ratings

Charged-device model (CDM)

1000

V

(1)

Stresses above these ratings may cause permanent damage. Exposure to absolute maximum conditions for extended periods may

degrade device reliability. These are stress ratings only, and functional operation of the device at these or any other conditions beyond

those specified is not implied.

(2)

Input terminals are diode-clamped to the power-supply rails. Input signals that can swing more than 0.5 V beyond the supply rails should

be current limited to 10 mA or less.

(3)

Short-circuit to ground, one amplifier per package.

2

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