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R1LP0108ESN-5SI Datasheet(PDF) 8 Page - Renesas Technology Corp |
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R1LP0108ESN-5SI Datasheet(HTML) 8 Page - Renesas Technology Corp |
8 / 14 page R1LP0108E Series R10DS0151EJ0100 Rev.1.00 Page 8 of 12 2013.6.21 Read Cycle Parameter Symbol R1LP0108E**-5** R1LP0108E**-7** Unit Note Min. Max. Min. Max. Read cycle time tRC 55 - 70 - ns Address access time tAA - 55 - 70 ns Chip select access time tACS1 - 55 - 70 ns tACS2 - 55 - 70 ns Output enable to output valid tOE - 30 - 35 ns Output hold from address change tOH 5 - 10 - ns Chip select to output in low-Z tCLZ1 5 - 10 - ns 2,3 tCLZ2 5 - 10 - ns 2,3 Output enable to output in low-Z tOLZ 5 - 5 - ns 2,3 Chip deselect to output in high-Z tCHZ1 0 20 0 25 ns 1,2,3 tCHZ2 0 20 0 25 ns 1,2,3 Output disable to output in high-Z tOHZ 0 20 0 25 ns 1,2,3 Write Cycle Parameter Symbol R1LP0108E**-5** R1LP0108E**-7** Unit Note Min. Max. Min. Max. Write cycle time tWC 55 - 70 - ns Address valid to end of write tAW 50 - 55 - ns Chip select to end of write tCW 50 - 55 - ns 5 Write pulse width tWP 45 - 50 - ns 4 Address setup time tAS 0 - 0 - ns 6 Write recovery time tWR 0 - 0 - ns 7 Data to write time overlap tDW 25 - 30 - ns Data hold from write time tDH 0 - 0 - ns Output enable from end of write tOW 5 - 5 - ns 2 Output disable to output in high-Z tOHZ 0 20 0 25 ns 1,2 Write to output in high-Z tWHZ 0 20 0 25 ns 1,2 Note 1. tCHZ, tOHZ and tWHZ are defined as the time at which the outputs achieve the open circuit conditions and are not referred to output voltage levels. 2. This parameter is sampled and not 100% tested. 3. At any given temperature and voltage condition, tHZ max is less than tLZ min both for a given device and from device to device. 4. A write occurs during the overlap of a low CS1#, a high CS2, a low WE#. A write begins at the latest transition among CS1# going low, CS2 going high and WE# going low. A write ends at the earliest transition among CS1# going high, CS2 going low and WE# going high. tWP is measured from the beginning of write to the end of write. 5. tCW is measured from the later of CS1# going low or CS2 going high to end of write. 6. tAS is measured the address valid to the beginning of write. 7. tWR is measured from the earliest of CS1# or WE# going high or CS2 going low to the end of write cycle. 8. Don’t apply inverted phase signal externally when DQ pin is output mode. |
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