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ADS5295IPFP Datasheet(PDF) 7 Page - Texas Instruments

Part # ADS5295IPFP
Description  12-Bit, 100-MSPS, 8-Channel Analog-to-Digital Converter
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Manufacturer  TI [Texas Instruments]
Direct Link  http://www.ti.com
Logo TI - Texas Instruments

ADS5295IPFP Datasheet(HTML) 7 Page - Texas Instruments

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ADS5295
www.ti.com
SBAS595 – DECEMBER 2012
TIMING REQUIREMENTS
(1)
Typical values are at +25°C, AVDD = 1.8 V, LVDD = 1.8 V, sampling frequency = 100 MSPS, sine-wave input clock, CLOAD =
5 pF, and RLOAD = 100 Ω, unless otherwise noted.
Minimum and maximum values are across the full temperature range of TMIN = –40°C to TMAX = +85°C, AVDD = 1.8 V, and
LVDD = 1.7 V to 1.9 V.
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
tA
Aperture delay
4
ns
Aperture delay matching
Between any two channels of the same device
±200
ps
Between two devices at the same temperature and
Variation of aperture delay
±1
ns
LVDD supply
tJ
Aperture jitter
Sample uncertainty
320
fs rms
Time to valid data after coming out of standby
5
µs
Wake-up time
Time to valid data after coming out of global power-
100
µs
down mode
One-wire LVDS Output interface
12
Clock cycles
ADC latency(2)
Two-wire LVDS Output interface
16
Clock cycles
TWO-WIRE, 12x SERIALIZATION
tSU
Data setup time
Data valid to zero-crossing of LCLKP
0.52
ns
tH
Data hold time
Zero-crossing of LCLKP to data becoming invalid
0.62
ns
tPDI =
Input clock rising edge crossover to output clock
(11/12)
tPDI
Clock propagation delay
ns
rising edge crossover
× tS +
tDELAY
tDELAY
Delay time
8.5
11
13.5
ns
Duty cycle of differential clock
LVDS bit clock duty cycle
50
%
(LCLKP – LCLKN)
ACROSS ALL SERIALIZATION MODES
Rise time measured from –100 mV to +100 mV,
tFALL
Data fall time
0.11
ns
10 MSPS
≤ sampling frequency ≤ 100 MSPS
Rise time measured from –100 mV to +100 mV,
tRISE
Data rise time
0.11
ns
10 MSPS
≤ sampling frequency ≤ 100 MSPS
Rise time measured from –100 mV to +100 mV,
tCLKRISE
Output clock rise time
0.11
ns
10 MSPS
≤ sampling frequency ≤ 100 MSPS
Rise time measured from –100 mV to +100 mV,
tCLKFALL
Output clock fall time
0.11
ns
10 MSPS
≤ sampling frequency ≤ 100 MSPS
(1)
Timing parameters are ensured by design and characterization, but are not tested in production.
(2)
At higher frequencies, tPDI is greater than one clock period and the overall latency = ADC latency + 1.
Copyright © 2012, Texas Instruments Incorporated
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