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LMV112 Datasheet(PDF) 3 Page - Texas Instruments |
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LMV112 Datasheet(HTML) 3 Page - Texas Instruments |
3 / 22 page LMV112 www.ti.com SNAS297B – MAY 2005 – REVISED MAY 2013 2.7V ELECTRICAL CHARACTERISTICS Unless otherwise specified, all limits are specified for TJ = 25°C, VDD = 2.7V, VSS = 0V, VCM = 1V, Enable1,2 = VDD, CL = 20 pF, RL = 30 kΩ, CCOUPLING = 1 nF. Boldface limits apply at temperature range extremes of operating condition. See (1). Symbol Parameter Conditions Min(2) Typ(3) Max(2) Units Frequency Domain Response SSBW Small Signal Bandwidth VIN = 0.63 VPP; −3 dB 40 MHz FPBW Full Power Bandwidth VIN = 1.6 VPP; −3 dB 28 MHz GFN Gain Flatness < 0.1 dB f > 100 kHz 3.4 MHz Distortion and Noise Performance en Input-Referred Voltage Noise f = 1 MHz 26 nV/ √Hz ISOLATION Output to Input f = 1 MHz 91 dB CT Crosstalk Rejection f = 26 MHz, PIN = 0 dBm 54 dB Time Domain Response tr Rise Time 0.1 VPP Step (10-90%), f = 1 MHz 7 ns tf Fall Time 6 ns ts Settling Time to 0.1% 1 VPP Step, f = 1 MHz 118 ns OS Overshoot 0.1 VPP Step, f = 1 MHz 41 % SR Slew Rate (4) VIN = 1.6 VPP, f = 26 MHz 110 V/µs Static DC Performance IS Supply Current Enable1,2 = VDD ; No Load 2.0 1.6 mA 2.1 Enable1,2 = VSS ; No Load 72 59 μA 78 PSRR Power Supply Rejection Ratio DC (3.0V to 5.0V) 58 68 dB 57 ACL Small Signal Voltage Gain VOUT = 0.1 VPP 0.97 1.05 1.01 V/V 0.95 1.07 VOS Output Offset Voltage 16 0.4 mV 17 TC VOS Temperature Coefficient Output Offset 4 µV/°C Voltage (5) ROUT Output Resistance f = 100 kHz 0.5 Ω f = 26 MHz 140 Miscellaneous Performance RIN Input Resistance per Buffer Enable = VDD 141 k Ω Enable = VSS 141 CIN Input Capacitance per Buffer Enable = VDD 2.3 pF Enable = VSS 2.3 ZIN Input Impedance f = 26 MHz, Enable = VDD 10.4 k Ω f = 26 MHz, Enable = VSS 10.9 VO Output Swing Positive VIN = VDD 2.65 2.69 V 2.63 Output Swing Negative VIN = VSS 50 10 mV 65 (1) Electrical Table values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in very limited self-heating of the device such that TJ = TA . (2) All limits are specified by testing or statistical analysis. (3) Typical Values represent the most likely parametric norm. (4) Slew rate is the average of the positive and negative slew rate. (5) Average Temperature Coefficient is determined by dividing the changing in a parameter at temperature extremes by the total temperature change. Copyright © 2005–2013, Texas Instruments Incorporated Submit Documentation Feedback 3 Product Folder Links: LMV112 |
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