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RC2512JK-0715RL Datasheet(PDF) 6 Page - List of Unclassifed Manufacturers

Part # RC2512JK-0715RL
Description  This specification describes RC2512 series chip resistors with fead-free terminations made by thick film process
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RC2512JK-0715RL Datasheet(HTML) 6 Page - List of Unclassifed Manufacturers

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Chip Resistor Surface Mount
www.yageo.com
Oct 20, 2009 V.4
Product specification
6
9
SERIES
RC
2512 (RoHS Compliant)
TESTS AND REQUIREMENTS
TEST
TEST METHOD
PROCEDURE
REQUIREMENTS
At +25/–55 °C and +25/+125 °C
Temperature
Coefficient of
Resistance
(T.C.R.)
IEC 60115-1 4.8
Formula:
T.C.R= ------------------------- ×106 (ppm/°C)
Where
t1=+25 °C or specified room temperature
t2=–55 °C or +125 °C test temperature
R1=resistance at reference temperature in ohms
R2=resistance at test temperature in ohms
Refer to table 2
Life/Endurance
IEC 60115-1 4.25.1
At 70±5 °C for 1,000 hours, RCWV applied for
1.5 hours on, 0.5 hour off, still air required
±(1.0%+0.05 Ω) for 1% tol.
±(3.0%+0.05 Ω) for 5% tol.
<100 mΩ for Jumper
High
Temperature
Exposure/
Endurance at
Upper Category
Temperature
IEC 60068-2-2
1,000 hours at 155±5 °C, unpowered
±(1.0%+0.05 Ω) for 1% tol.
±(2.0%+0.05 Ω) for 5% tol.
<50 mΩ for Jumper
Moisture
Resistance
MIL-STD-202G Method-106G
Each temperature / humidity cycle is defined at 8
hours, 3 cycles / 24 hours for 10d. with 25 °C /
65 °C 95% R.H, without steps 7a & 7b,
unpowered
Parts mounted on test-boards, without
condensation on parts
Measurement at 24±2 hours after test conclusion
±(0.5%+0.05 Ω) for 1% tol.
±(2.0%+0.05 Ω) for 5% tol.
<100 mΩ for Jumper
Thermal Shock
MIL-STD-202G Method-107G
-55/+125 °C
Number of cycles required is 300. Devices
unmounted
Maximum transfer time is 20 seconds. Dwell time
is 15 minutes. Air – Air
±(0.5%+0.05 Ω) for 1% tol.
±(1%+0.05 Ω) for 5% tol.
<50 mΩ for Jumper
Short Time
Overload
IEC60115-1 4.13
2.5 times of rated voltage or maximum overload
voltage whichever is less for 5 sec at room
temperature
±(1.0%+0.05 Ω) for 1% tol.
±(2.0%+0.05 Ω) for 5% tol.
<50 mΩ for Jumper
No visible damage
Table 4 Test condition, procedure and requirements
R2–R1
R1(t2–t1)


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