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AFCT-5765ANPZ Datasheet(PDF) 6 Page - AVAGO TECHNOLOGIES LIMITED |
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AFCT-5765ANPZ Datasheet(HTML) 6 Page - AVAGO TECHNOLOGIES LIMITED |
6 / 19 page 6 Electrostatic Discharge (ESD) There are two conditions in which immunity to ESD dam- age is important: The first condition is static discharge to the transceiver during handling such as when the transceiver is inserted into the transceiver port. To protect the transceiver, it is important to use normal ESD handling precautions includ- ing the use of grounded wrist straps, work benches, and floor mats in ESD controlled areas. The ESD sensitivity of the AFCT-576xZ is compatible with typical industry pro- duction environments. The second condition is static discharge to the exterior of the host equipment chassis after installation. To the extent that the duplex LC optical interface is exposed to the outside of the host equipment chassis, it may be subject to system-level ESD requirements. The ESD performance of the AFCT-576xZ exceeds typical industry standards. Table 1 documents ESD immunity to both of these conditions. Electromagnetic Interference (EMI) Most equipment designs using the AFCT-576xZ SFPs are subject to the requirements of the FCC in the United States, CENELEC EN55022 (CISPR 22) in Europe and VCCI in Japan. The metal housing and shielded design of the transceiver minimize EMI and provide excellent EMI performance. EMI Immunity The AFCT-576xZ transceivers have a shielded design to provide excellent immunity to radio frequency electro- magnetic fields which may be present in some operating environments. Eye Safety The AFCT-576xZ transceivers provide Class 1 eye safety by design. Avago Technologies has tested the transceiver design for regulatory compliance, under normal operat- ing conditions and under a single fault condition. See Table 1. Flammability The AFCT-576xZ family of SFPs is compliant to UL 94V-0. Customer Manufacturing Processes This module is pluggable and is not designed for aque- ous wash, IR reflow, or wave soldering processes. Caution The AFCT-576xZ contains no user-serviceable parts. Tam- pering with or modifying the performance of the AFCT- 576xZ will result in voided product warranty. It may also result in improper operation of the transceiver circuitry, and possible over-stress of the laser source. Device deg- radation or product failure may result. Connection of the AFCT-576xZ to a non-approved optical source, operating above the recommended absolute maximum conditions may be considered an act of modifying or manufacturing a laser product. The person(s) performing such an act is required by law to re-certify and re-identify the laser product under the provisions of U.S. 21 CF. Handling Precautions The AFCT-576xZ can be damaged by current surges or overvoltage. Power supply transient precautions should be taken, and normal handling precautions for electro- static sensitive devices should be taken. Optical Power Budget The worst-case Optical Power Budget (OPB) in dB for a fiber-optic link is determined by the difference between the minimum transmitter output optical power (dBm avg) and the lowest receiver sensitivity (dBm avg). This OPB provides the necessary optical signal range to es- tablish a working fiber-optic link. The OPB is allocated for the fiber-optic cable length and the corresponding link penalties. For proper link performance, all penalties that affect the link performance must be accounted for within the link optical power budget. Process Plug This transceiver is supplied with a process plug for protection of the optical port within the LC connector receptacle. This process plug prevents contamination during handling, shipping and storage. It is made of a high-temperature, molded sealing material that can withstand +85 °C. LC SFP Cleaning Recommendations In the event of contamination of the optical ports, the recommended cleaning process is the use of forced ni- trogen. If contamination is thought to have remained, the optical ports can be cleaned using a NTT international Cletop stick type (diam. 1.25 mm) and HFE7100 cleaning fluid. |
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