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LKT0805X0R5D160R Datasheet(PDF) 5 Page - Kingtronics International Company |
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LKT0805X0R5D160R Datasheet(HTML) 5 Page - Kingtronics International Company |
5 / 8 page Website: www.kingtronics.com Email: info@kingtronics.com Tel: (852) 8106 7033 Fax: (852) 8106 7099 5 LKT Low Voltage Multilayer Chip Ceramic Capacitor 11. Bending Dielectrics Specification Testing Condition NPO No remarkable visual damage Cp change ≤ ±5% or ≤ 0.5 pF Solder the capacitor on testing substrate and put it on testing stand. The middle part of substrate shall successively be pressurized by pressuring rod at a rated of about 1.0mm/sec. Until the deflection become means of the 1.0mm. X7R/X5R No remarkable visual damage Cp change ≤ ±12.5% Y5V No remarkable visual damage Cp change ≤ ±30% 12. Resistance to Soldering Heat Dielectrics Specification Testing Condition NPO No remarkable visual damage Cp change within ±2.5% or ±0.25pF, whichever is larger. DF meets initial standard value. IR meets initial standard value. Soldering temperature: 270±5℃ Preheating: 120~150 60sec. ℃ Dipping time: 10±1 seconds. Measurement to be made after being kept at room temperature for 24±2 (COG) or 48±4(X7R ,X5R, Y5V) hours. Recovery for the following period under the standard condition after test. *Initial measurement for high dielectric constant type Perform a heat treatment at 140~150 for 1hr and let sit ℃ for 48±4hrs at room temperature. Perform the initial measurement. X7R/X5R No remarkable visual damage Cp change within ±5% DF meets initial standard value. IR meets initial standard value. Y5V No remarkable visual damage Cp change within ±20% DF meets initial standard value. IR meets initial standard value. 13. Temperature Cycle Dielectrics Specification Testing Condition NPO No remarkable visual damage Cp change within ±2.5% or ±0.25pF, whichever is larger. To perform 5 cycles of the stated environment: Step Temperature Time 1 Min. operating Temp.+0/-3℃ 30min 2 25℃ 2~3 min 3 Max. operating Temp.+0/-3℃ 30 min X7R/X5R No remarkable visual damage Cp change within ±7.5% 4 25℃ 2~3 min Measurement to be made after being kept at room temperature for 24±2hrs (COG) or 48±4hrs (X7R, X5R, Y5V) at room temperature, then measure. *Initial measurement for high dielectric constant type Perform a heat treatment at 140~150℃ for 1hr and let sit for 48±4hrs at room temperature. Perform the initial measurement. |
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