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MT46V128M4 Datasheet(PDF) 5 Page - Micron Technology

Part # MT46V128M4
Description  512Mb: x4, x8, x16 Double Data Rate (DDR) SDRAM SDRAM Features
Download  93 Pages
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Manufacturer  MICRON [Micron Technology]
Direct Link  http://www.micron.com
Logo MICRON - Micron Technology

MT46V128M4 Datasheet(HTML) 5 Page - Micron Technology

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PDF: 09005aef80768abb/Source: 09005aef82a95a3a
Micron Technology, Inc., reserves the right to change products or specifications without notice.
DDR_x4x8x16_Core1.fm - 512Mb DDR: Rev. Q; Core DDR Rev. E 7/11 EN
5
©2000 Micron Technology, Inc. All rights reserved.
512Mb: x4, x8, x16 DDR SDRAM
Functional Description
Functional Description
The DDR SDRAM uses a double data rate architecture to achieve high-speed operation.
The double data rate architecture is essentially a 2n-prefetch architecture with an inter-
face designed to transfer two data words per clock cycle at the I/O pins. A single read or
write access for the DDR SDRAM effectively consists of a single 2n-bit-wide, one-clock-
cycle data transfer at the internal DRAM core and two corresponding n-bit-wide, one-
half-clock-cycle data transfers at the I/O pins.
A bidirectional data strobe (DQS) is transmitted externally, along with data, for use in
data capture at the receiver. DQS is a strobe transmitted by the DDR SDRAM during
READs and by the memory controller during WRITEs. DQS is edge-aligned with data for
READs and center-aligned with data for WRITEs. The x16 offering has two data strobes,
one for the lower byte and one for the upper byte.
The DDR SDRAM operates from a differential clock (CK and CK#); the crossing of CK
going HIGH and CK# going LOW will be referred to as the positive edge of CK.
Commands (address and control signals) are registered at every positive edge of CK.
Input data is registered on both edges of DQS, and output data is referenced to both
edges of DQS, as well as to both edges of CK.
Read and write accesses to the DDR SDRAM are burst oriented; accesses start at a
selected location and continue for a programmed number of locations in a programmed
sequence. Accesses begin with the registration of an ACTIVE command, which may then
be followed by a READ or WRITE command. The address bits registered coincident with
the ACTIVE command are used to select the bank and row to be accessed. The address
bits registered coincident with the READ or WRITE command are used to select the bank
and the starting column location for the burst access.
The DDR SDRAM provides for programmable READ or WRITE burst lengths of 2, 4, or 8
locations. An auto precharge function may be enabled to provide a self-timed row
precharge that is initiated at the end of the burst access.
As with standard SDR SDRAMs, the pipelined, multibank architecture of DDR SDRAMs
allows for concurrent operation, thereby providing high effective bandwidth by hiding
row precharge and activation time.
An auto refresh mode is provided, along with a power-saving power-down mode. All
inputs are compatible with the JEDEC standard for SSTL_2. All full-drive option outputs
are SSTL_2, Class II compatible.
General Notes
• The functionality and the timing specifications discussed in this data sheet are for the
DLL-enabled mode of operation.
• Throughout the data sheet, the various figures and text refer to DQs as “DQ.” The DQ
term is to be interpreted as any and all DQ collectively, unless specifically stated
otherwise. Additionally, the x16 is divided into two bytes, the lower byte and upper
byte. For the lower byte (DQ[7:0]) DM refers to LDM and DQS refers to LDQS. For the
upper byte (DQ[15:8]) DM refers to UDM and DQS refers to UDQS.
• Complete functionality is described throughout the document and any page or
diagram may have been simplified to convey a topic and may not be inclusive of all
requirements.
• Any specific requirement takes precedence over a general statement.


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