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ADG506ABQ Datasheet(PDF) 6 Page - Analog Devices |
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ADG506ABQ Datasheet(HTML) 6 Page - Analog Devices |
6 / 8 page ADG506A/ADG507A –6– REV. C –Test Circuits Note: All Digital Input Signal Rise and Fall Times Measured from 10% to 90% of 3 V. tR = tF = 20 ns. Test Circuit 6. Switching Time of Multiplexer, tTRANSITION Test Circuit 7. Break-Before-Make Delay, tOPEN Test Circuit 1. RON Test Circuit 2. IS (OFF) Test Circuit 3. ID (OFF) Test Circuit 4. ID (ON) Test Circuit 5. IDIFF |
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