DAC1220

This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with

appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more

susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.

PACKAGE/ORDERING INFORMATION

For the most current package and ordering information see the Package Option Addendum at the end of this

document, or see the TI web site at www.ti.com.

ABSOLUTE MAXIMUM RATINGS

(1)

Over operating free-air temperature range (unless otherwise noted).

DAC1220

UNIT

±0.3

V

–0.3 to +6

V

–0.3 to +6

V

AGND to DGND

±0.3

V

+2.0 to +3.0

V

Digital input voltage to DGND

V

Digital output voltage to DGND

V

Package power dissipation

W

+150

°C

SSOP-16

200

°C/W

Lead temperature (soldering, 10s)

+300

°C

(1)

Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings

only, and functional operation of the device at these or any other conditions beyond those indicated under the Electrical Characteristics

is not implied. Exposure to absolute maximum rated conditions for extended periods may affect device reliability.

2

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