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BUJ302AD Datasheet(PDF) 3 Page - NXP Semiconductors |
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BUJ302AD Datasheet(HTML) 3 Page - NXP Semiconductors |
3 / 14 page BUJ302AD All information provided in this document is subject to legal disclaimers. © NXP B.V. 2011. All rights reserved. Product data sheet Rev. 01 — 28 March 2011 3 of 14 NXP Semiconductors BUJ302AD NPN power transistor Fig 1. Reverse bias safe operating area Fig 2. Test circuit for reverse bias safe operating area Fig 3. Normalized total power dissipation as a function of mounting base temperature 003aag027 VCEclamp (V) 0 1200 800 400 4 6 2 8 10 IC (A) 0 001aab999 DUT LC LB IBon VBB VCC VCL(CE) probe point Tmb (°C) 0 160 120 40 80 001aab993 40 80 120 Pder (%) 0 |
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