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LMP90079 Datasheet(PDF) 1 Page - Texas Instruments

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Part # LMP90079
Description  Multi-Channel, Low-Power 16-Bit Sensor AFE with True Continuous Background Calibration
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Manufacturer  TI [Texas Instruments]
Direct Link  http://www.ti.com
Logo TI - Texas Instruments

LMP90079 Datasheet(HTML) 1 Page - Texas Instruments

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LMP90077, LMP90078, LMP90079, LMP90080
www.ti.com
SNAS521F – JULY 2011 – REVISED MARCH 2013
LMP90080/LMP90079/LMP90078/LMP90077 Sensor AFE System: Multi-Channel, Low-
Power 16-Bit Sensor AFE with True Continuous Background Calibration
Check for Samples: LMP90077, LMP90078, LMP90079, LMP90080
1
FEATURES
APPLICATIONS
23
16-Bit Low-Power Sigma Delta ADC
Temperature and Pressure Transmitters
True Continuous Background Calibration at All
Strain Gauge Interface
Gains
Industrial Process Control
In-Place System Calibration Using Expected
Value Programming
DESCRIPTION
The LMP90080/LMP90079/LMP90078/LMP90077 are
Low-Noise Programmable Gain (1x - 128x)
highly integrated, multi-channel, low-power 16-bit
Continuous Background Open/Short and Out
Sensor AFEs. The devices feature a precision, 16-bit
of Range Sensor Diagnostics
Sigma Delta Analog-to-Digital Converter (ADC) with a
8 Output Data Rates (ODR) with Single-Cycle
low-noise programmable gain amplifier and a fully
Settling
differential high impedance analog input multiplexer.
A true continuous background calibration feature
2 Matched Excitation Current Sources from
allows calibration at all gains and output data rates
100 µA to 1000 µA (LMP90080/LMP90078)
without interrupting the signal path. The background
4-DIFF / 7-SE Inputs (LMP90080/LMP90079)
calibration feature essentially eliminates gain and
2-DIFF / 4-SE Inputs (LMP90078/LMP90077)
offset errors across temperature and time, providing
measurement accuracy without sacrificing speed and
7 General Purpose Input/Output Pins
power consumption.
Chopper-Stabilized Buffer for Low Offset
Another
feature
of
the
LMP90080/LMP90079
SPI 4/3-Wire with CRC Data Link Error
/LMP90078/LMP90077
is
continuous
background
Detection
sensor diagnostics, allowing the detection of open
50 Hz to 60 Hz Line Rejection at ODR
≤13.42
and short circuit conditions and out-of-range signals,
SPS
without
requiring
user
intervention,
resulting
in
enhanced system reliability.
Independent Gain and ODR Selection per
Channel
Two sets of independent external reference voltage
Supported by WEBENCH® Sensor AFE
pins allow multiple ratiometric measurements. In
addition, two matched programmable current sources
Designer
are available in the LMP90080/LMP90078 to excite
Automatic Channel Sequencer
external
sensors
such
as
resistive
temperature
detectors and bridge sensors. Furthermore, seven
KEY SPECIFICATIONS
GPIO pins are provided for interfacing to external
ENOB/NFR: Up to 16/16 Bits
LEDs and switches to simplify control across an
isolation barrier.
Offset Error (typ): 8.4 nV
Collectively, these features make the LMP90080
Gain Error (typ): 7 ppm
/LMP90079/LMP90078/LMP90077 complete analog
Total Noise: <10 µV-rms
front-ends
for
low-power,
precision
sensor
Integral Non-Linearity (INL Max): ±1 LSB
applications such as temperature, pressure, strain
Output Data Rates (ODR): 1.6775 - 214.65 SPS
gauge,
and
industrial
process
control.
The
LMP90080/LMP90079/LMP90078/LMP90077
are
Analog Voltage, VA: +2.85 to +5.5 V
ensured over the extended temperature range of -
Operating Temp Range: -40 to 125°C
40°C to +125°C and are available in a 28-pin
Package: 28 Pin Exposed Pad
package with an exposed pad.
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
2
WEBENCH is a registered trademark of Texas Instruments.
3
All other trademarks are the property of their respective owners.
PRODUCTION DATA information is current as of publication date.
Copyright © 2011–2013, Texas Instruments Incorporated
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.


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