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ISL9N2357D3ST Datasheet(PDF) 1 Page - Fairchild Semiconductor |
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ISL9N2357D3ST Datasheet(HTML) 1 Page - Fairchild Semiconductor |
1 / 9 page ©2002 Fairchild Semiconductor Corporation ISL9N2357D3ST Rev. B1 ISL9N2357D3ST 30V, 0.007 Ohm, 35A, N-Channel UltraFET® Trench Power MOSFET UltraFET® Trench from Fairchild is a new advanced MOSFET technology that achieves the lowest possible on- resistance per silicon area while maintaining fast switching and low gate charge. The reduced conduction and switching losses extend battery life in notebook PCs, cellular telephones and other portable information appliances and improve the overall efficiency of high frequency DC-DC converters used to power the latest microprocessors. Packaging ISL9N2357D3ST JEDEC TO-252AA Features •rDS(ON) = 0.006Ω Typical, VGS = 10V •Qg Total 85nC Typical, VGS = 10V •Qgd 16nC Typical •CISS 5600pF Typical Symbol GATE SOURCE DRAIN (FLANGE) Ordering Information PART NUMBER PACKAGE BRAND ISL9N2357D3ST TO-252AA N2357D NOTE: When ordering, use the entire part number. e.g., ISL9N2357D3ST. UltraFET® Trench D G S Absolute Maximum Ratings TC = 25 oC, Unless Otherwise Specified SYMBOL PARAMETER ISL9N2357D3ST UNITS VDSS Drain to Source Voltage (Note 1) 30 V VDGR Drain to Gate Voltage (RGS = 20kΩ) (Note 1) 30 V VGS Gate to Source Voltage ±20 V ID ID IDM Drain Current Continuous (TC = 25 oC, V GS = 10V) (Figure 2) Continuous (TC = 100 oC, V GS = 10V) Pulsed Drain Current 35 35 Figure 4 A A A PD Power Dissipation Derate Above 25oC 100 0.67 W W/oC TJ, TSTG Operating and Storage Temperature -55 to 175 oC TL Tpkg Maximum Temperature for Soldering Leads at 0.063in (1.6mm) from Case for 10s Package Body for 10s, See Techbrief TB334 300 260 oC oC THERMAL SPECIFICATIONS RθJC Thermal Resistance Junction to Case, TO-252 1.5 oC/W RθJA Thermal Resistance Junction to Ambient TO-252 100 oC/W NOTE: 1. TJ = 25 oC to 150oC. CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Data Sheet June 2002 |
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