6

AC Electrical Specifications

otherwise specified).

Parameter

Symbol

Subgroups

Min.

Typ.*

Max.

Units

Test Conditions

Fig.

Note

Common Mode

Rejection

CMR

9

5

8

5.0

kV/

s

16

8, 13

Propagation

Delay to 50%

9, 10, 11

3.7

7.5

s

≤ 5.5 V

18, 19

Propagation

Delay to 90%

9, 10, 11

5.7

11.0

Rise/Fall Time

(10-90%)

9, 10, 11

3.4

7.5

Small-Signal

Bandwidth

(-3 dB)

9, 10, 11

45

100

kHz

≤ 5.5 V

18, 20,

21

14

Small-Signal

Bandwidth

(-45°)

RMS Input-

Referred Noise

0.6

In recommended

application circuit

22, 24

9

Power Supply

Rejection

PSR

570

10

*

Notes:

1.

2.

Exact offset value is dependent on layout of external bypass capacitors. The offset value in the data sheet corresponds to Avago’s recommended

layout (see Figures 26 and 27).

3.

Nonlinearity is defined as half of the peak-to-peak output deviation from the best-fit gain line, expressed as a percentage of the full-scale

differential output voltage.

4.

Because of the switched capacitor nature of the sigma-delta A/D converter, time averaged values are shown.

5.

to both pins 2 and 3 with respect to pin 4.

6.

When the differential input signal exceeds approximately 320 mV, the outputs will limit at the typical values shown.

7.

operations under these conditions.

8.

CMR (also known as IMR or Isolation Mode Rejection) specifies the minimum rate of rise of a common mode signal applied across the isolation

boundary at which small output perturbations begin to occur. These output perturbations can occur with both the rising and falling edges of

the common mode waveform and may be of either polarity. A CMR failure is defined as a perturbation exceeding 200 mV at the output of the

recommended application circuit (Figure 24). See Applications section for more information on CMR.

9.

Output noise comes from two primary sources: chopper noise and sigma-delta quantization noise. Chopper noise results from chopper

stabilization of the output op-amps. It occurs at a specific frequency (typically 500 kHz) and is not attenuated by the on-chip output filter. The

on-chip filter does eliminate most, but not all, of the sigma-delta quantization noise. An external filter circuit may be easily added to the external

post-amplifier to reduce the total RMS output noise. See Applications section for more information.

11. Device considered a two-terminal device: Pins 1, 2, 3, and 4 are shorted together and pins 5, 6, 7, and 8 are shorted together.

12. Commercial parts receive 100% testing at 25° C (Subgroups 1 and 9). Hi-Rel and SMD parts receive 100% testing at 25° C, +125° C and -55° C

(Subgroups 1 and 9, 2 and 10, 3 and 11, respectively).

13. Parameters are tested as part of device initial characterization and after design and process changes only. Parameters are guaranteed to limits

specified for all lots not specifically tested.