3

Notes:

1. Data sample size is 3000 samples taken from 3 different wafers and 2 different lots. Future wafers allocated to this product may have nominal

values anywhere between the upper and lower limits.

2. Measurements are made on production test board which represents a trade-off between optimal Gain, NF, OIP3 and OP1dB. Circuit losses have

been de-embedded from actual measurements.

70

80

1.7

1.8

1.8

2.1

2.2

2

2.3

20.8

21 21.1

21.7

21.3

21.5

21.9

22.1

22

38

39

40

41

21

22

23

Figure 2. Id @ 900MHz, Vd=5V, LSL=62mA, Nominal=76mA, USL=90mA

Figure 3. NF @ 900MHz, Vd=5V, Nominal=2.0dB, USL=2.5dB

Figure 4. Gain @ 900MHz, Vd=5V, LSL=20dB, Nominal=21.5dB, USL=23dB

Figure 5. OIP3 @ 900MHz, Vd=5V, LSL=36.3dBm, Nominal=39.3dBm

Figure 6. P1dB @ 900MHz, Vd=5V, LSL= 20.6dBm, Nominal=22.2dBm