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ADC101S051 Datasheet(PDF) 6 Page - Texas Instruments

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Part # ADC101S051
Description  ADC081S051 Single Channel, 200 to 500 ksps, 8-Bit A/D Converter
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Manufacturer  TI [Texas Instruments]
Direct Link  http://www.ti.com
Logo TI - Texas Instruments

ADC101S051 Datasheet(HTML) 6 Page - Texas Instruments

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ADC081S051
SNAS309E – APRIL 2005 – REVISED MARCH 2013
www.ti.com
ADC081S051 Timing Specifications
The following specifications apply for VA = +2.7V to 5.25V, GND = 0V, fSCLK = 4 MHz to 10 MHz, CL = 25 pF,
fSAMPLE = 200 ksps to 500 ksps, Boldface limits apply for TA = TMIN to TMAX: all other limits TA = 25°C.
Symbol
Parameter
Conditions
Typical
Limits
Units
tCS
Minimum CS Pulse Width
10
ns (min)
tSU
CS to SCLK Setup Time
10
ns (min)
tEN
Delay from CS Until SDATA TRI-STATE Disabled(1)
20
ns (max)
VA = +2.7V to +3.6V
40
ns (max)
tACC
Data Access Time after SCLK Falling Edge(2)
VA = +4.75V to +5.25V
20
ns (max)
tCL
SCLK Low Pulse Width
0.4 x tSCLK
ns (min)
tCH
SCLK High Pulse Width
0.4 x tSCLK
ns (min)
VA = +2.7V to +3.6V
7
ns (min)
tH
SCLK to Data Valid Hold Time
VA = +4.75V to +5.25V
5
ns (min)
25
ns (max)
VA = +2.7V to +3.6V
6
ns (min)
tDIS
SCLK Falling Edge to SDATA High Impedance(3)
25
ns (max)
VA = +4.75V to +5.25V
5
ns (min)
tPOWER-
Power-Up Time from Full Power-Down
1
µs
UP
(1)
Measured with the timing test circuit shown in Figure 2 and defined as the time taken by the output signal to cross 1.0V.
(2)
Measured with the timing test circuit shown in Figure 2 and defined as the time taken by the output signal to cross 1.0V or 2.0V.
(3)
tDIS is derived from the time taken by the output to change by 0.5V with the timing test circuit shown in Figure 2. The measured number
is then adjusted to remove the effects of charging or discharging the load capacitance. This means that tDIS is the true bus relinquish
time, independent of the bus loading.
6
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