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TLV5627CPWRG4 Datasheet(PDF) 5 Page - Texas Instruments |
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TLV5627CPWRG4 Datasheet(HTML) 5 Page - Texas Instruments |
5 / 23 page TLV5627C, TLV5627I 2.7V TO 5.5V 8BIT 4CHANNEL DIGITALTOANALOG CONVERTERS WITH POWER DOWN SLAS232A − JUNE1999 − REVISED JULY 2002 5 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 electrical characteristics over recommended operating free-air temperature range (unless otherwise noted) (continued) individual DAC output specifications PARAMETER TEST CONDITIONS MIN TYP MAX UNIT VO Voltage output RL = 10 kΩ 0 AVDD−0.4 V Output load regulation accuracy RL = 2 kΩ vs 10 kΩ 0.1 0.25 % of FS voltage reference input (REFINAB, REFINCD) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT VI Input voltage range See Note 8 0 AVDD−1.5 V RI Input resistance 10 M Ω CI Input capacitance 5 pF Reference feed through REFIN = 1 Vpp at 1 kHz + 1.024 V dc (see Note 9) −75 dB Reference input bandwidth REFIN = 0.2 Vpp + 1.024 V dc Slow 0.5 MHz Reference input bandwidth REFIN = 0.2 Vpp + 1.024 V dc Fast 1 MHz NOTES: 8. Reference input voltages greater than VDD/2 will cause output saturation for large DAC codes. 9. Reference feedthrough is measured at the DAC output with an input code = 000 hex and a Vref(REFINAB or REFINCD) input = 1.024 Vdc + 1 Vpp at 1 kHz. digital inputs (D0−D11, CS, WEB, LDAC, PD) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT IIH High-level digital input current VI = DVDD ±1 µA IIL Low-level digital input current VI = 0 V ±1 µA CI Input capacitance 3 pF power supply PARAMETER TEST CONDITIONS MIN TYP MAX UNIT 5-V supply, No load, Clock running Slow 1.4 2.2 mA IDD Power supply current 5-V supply, No load, Clock running Fast 3.5 5.5 mA IDD Power supply current 3-V supply, No load, Clock running Slow 1 1.5 mA 3-V supply, No load, Clock running Fast 3 4.5 mA Power down supply current, See Figure 12 1 µA PSRR Power supply rejection ratio Zero scale gain See Notes 10 and 11 −68 dB PSRR Power supply rejection ratio Gain See Notes 10 and 11 −68 dB 10. Zero-scale-error rejection ratio (EZS−RR) is measured by varying the AVDD from 5 ±0.5 V and 3 ±0.3 V dc, and measuring the proportion of this signal imposed on the zero-code output voltage. 11. Gain-error rejection ratio (EG-RR) is measured by varying the AVDD from 5 ±0.5 V and 3 ±0.3 V dc and measuring the proportion of this signal imposed on the full-scale output voltage after subtracting the zero scale change. |
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