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NM25C160LMT8 Datasheet(PDF) 4 Page - Fairchild Semiconductor

Part # NM25C160LMT8
Description  16K-Bit Serial CMOS EEPROM (Serial Peripheral Interface (SPI) Synchronous Bus)
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Manufacturer  FAIRCHILD [Fairchild Semiconductor]
Direct Link  http://www.fairchildsemi.com
Logo FAIRCHILD - Fairchild Semiconductor

NM25C160LMT8 Datasheet(HTML) 4 Page - Fairchild Semiconductor

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NM25C160 Rev. D.1
Low Voltage 2.7V
V
CC 4.5V Specifications
Absolute Maximum Ratings (Note 5)
Ambient Storage Temperature
-65
°C to +150°C
All Input or Output Voltage with
Respect to Ground
+6.5V to -0.3V
Lead Temp. (Soldering, 10 sec.)
+300
°C
ESD Rating
2000V
Operating Conditions
Ambient Operating Temperature
NM25C160L/LZ
0
°C to +70°C
NM25C160LZ/LZE
-40
°C to +85°C
NM25C160LV
-40
°C to +125°C
Power Supply (VCC)
2.7V–4.5V
DC and AC Electrical Characteristics 2.7V
≤ V
CC ≤ 4.5V (unless otherwise specified)
25C160L/LE
25C160LV
25C160LZ/LZE
Symbol
Parameter
Part
Conditions
Min.
Max.
Min
Max
Units
ICC
Operating Current
CS = VIL
33
mA
I
CCSB
Standby Current
L
CS = V
CC
10
10
µA
LZ
1
N/A
µA
I
IL
Input Leakage
V
IN = 0 to VCC
-1
1
-1
1
µA
IOL
Output Leakage
VOUT = GND to VCC
-1
1
-1
1
µA
V
IL
Input Low Voltage
-0.3
V
CC * 0.3
-0.3
V
CC * 0.3
V
V
IH
Input High Voltage
0.7 * V
CC
V
CC + 0.3
0.7 * V
CC
V
CC + 0.3
V
V
OL
Output Low Voltage
I
OL = 0.8 mA
0.4
0.4
V
VOH
Output High Voltage
IOH = –0.8 mA
VCC - 0.8
VCC - 0.8
V
f
OP
SCK Frequency
1.0
1.0
MHz
t
RI
Input Rise Time
2.0
2.0
µs
t
FI
Input Fall Time
2.0
2.0
µs
tCLH
Clock High Time
(Note 6)
410
410
ns
t
CLL
Clock Low Time
(Note 6)
410
410
ns
t
CSH
Min. CS High Time
(Note 7)
500
500
ns
t
CSS
CS Setup Time
500
500
ns
tDIS
Data Setup Time
100
100
ns
t
HDS
HOLD Setup Time
240
240
ns
t
CSN
CS Hold Time
500
500
ns
t
DIN
Data Hold Time
100
100
ns
tHDN
HOLD Hold Time
240
240
ns
t
PD
Output Delay
C
L = 200 pF
500
500
ns
t
DH
Output Hold Time
0
0
ns
t
LZ
HOLD Output Low Z
240
240
ns
tDF
Output Disable Time
CL = 200 pF
500
500
ns
t
HZ
HOLD to Output Hi Z
240
240
ns
t
WP
Write Cycle Time
1-16 Bytes
15
15
ms
Capacitance T
A = 25°C, f = 2.1/1 MHz (Note 8)
Symbol
Test
Typ Max Units
COUT
Output Capacitance
3
8
pF
CIN
Input Capacitance
2
6
pF
AC Test Conditions
Output Load
I
OL = 10 µA, IOH = 10 µA
Input Pulse Levels
0.3V to 3.5V
Timing Measurement Reference Level
Input
0.4V and 1.6V
Output
0.8V and 1.6V
Note 5: Stress above those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress rating only, and functional operation of the device
at these or any other conditions above those indicated in the operational sections of the specification is not implied. Exposure to absolute maximum rating conditions for extended
periods may affect device reliability.
Note 6: The f
OP frequency specification specifies a minimum clock period of 1/fOP. Therefore, for every fOP clock cycle, tCLH + tCLL must be equal to or greater than 1/fOP. For
example, if the 2.1MHz period = 476ns and t
CLH = 190ns, tCLL must be 286ns.
Note 7: CS must be brought high for a minimum of tCSH between consecutive instruction cycles.
Note 8: This parameter is periodically sampled and not 100% tested.


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