MC74VHC1G02

http://onsemi.com

2

MAXIMUM RATINGS

Symbol

Characteristics

Value

Unit

DC Supply Voltage

−0.5 to +7.0

V

DC Input Voltage

−0.5 to +7.0

V

DC Output Voltage

High or Low State

−0.5 to 7.0

V

Input Diode Current

−20

mA

Output Diode Current

+20

mA

DC Output Current, per Pin

+25

mA

+50

mA

Power Dissipation in Still Air at 85

°C

SC70−5/SC−88A

TSOP−5

150

200

mW

Thermal Resistance

SC70−5/SC−88A (Note 1)

TSOP−5

350

230

°C/W

Lead Temperature, 1 mm from Case for 10 Seconds

260

°C

Junction Temperature Under Bias

)150

°C

Storage Temperature Range

*65 to )150

°C

ESD Withstand Voltage

Human Body Model (Note 2)

Machine Model (Note 3)

Charged Device Model (Note 4)

> 2000

> 200

N/A

V

Latchup Performance

$500

mA

Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the

Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect

device reliability.

1. Measured with minimum pad spacing on an FR4 board, using 10 mm−by−1 inch, 2−ounce copper trace with no air flow.

2. Tested to EIA/JESD22−A114−A.

3. Tested to EIA/JESD22−A115−A.

4. Tested to JESD22−C101−A.

5. Tested to EIA/JESD78.

RECOMMENDED OPERATING CONDITIONS

Symbol

Characteristics

Min

Max

Unit

DC Supply Voltage

2.0

5.5

V

DC Input Voltage

0.0

5.5

V

DC Output Voltage

0.0

V

Operating Temperature Range

−55

+125

°C

Input Rise and Fall Time

0

0

100

20

ns/V

DEVICE JUNCTION TEMPERATURE VERSUS

TIME TO 0.1% BOND FAILURES

Junction

Temperature

°C

Time, Hours

Time, Years

80

1,032,200

117.8

90

419,300

47.9

100

178,700

20.4

110

79,600

9.4

120

37,000

4.2

130

17,800

2.0

140

8,900

1.0

1

1

10

100

1000

FAILURE RATE OF PLASTIC = CERAMIC

UNTIL INTERMETALLICS OCCUR

Figure 3. Failure Rate vs. Time Junction Temperature

TIME, YEARS