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RFP3055LE Datasheet(PDF) 2 Page - Fairchild Semiconductor |
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RFP3055LE Datasheet(HTML) 2 Page - Fairchild Semiconductor |
2 / 8 page ©2002 Fairchild Semiconductor Corporation RFD3055LE, RFD3055LESM, RFP3055LE Rev. B Absolute Maximum Ratings TC = 25 oC, Unless Otherwise Specified RFD3055LE, RFD3055LESM, RFP3055LE UNITS Drain to Source Voltage (Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . VDSS 60 V Drain to Gate Voltage (RGS = 20kΩ) (Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . . VDGR 60 V Gate to Source Voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .VGS ±16 V Continuous Drain Current . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ID Pulsed Drain Current (Note 3) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . IDM 11 Refer to Peak Current Curve A Single Pulse Avalanche Rating . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .EAS Refer to UIS Curve Power Dissipation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .PD Derate Above 25oC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 38 0.25 W W/oC Operating and Storage Temperature . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . TJ, TSTG -55 to 175 oC Maximum Temperature for Soldering Leads at 0.063in (1.6mm) from Case for 10s . . . . . . . . . . . . . . . . . . . . . . . . . . . . TL Package Body for 10s, See Techbrief 334 . . . . . . . . . . . . . . . . . . . . . . . . . . . . Tpkg 300 260 oC oC CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. NOTE: 1. TJ = 25 oC to 150oC. Electrical Specifications TC = 25 oC, Unless Otherwise Specified PARAMETER SYMBOL TEST CONDITIONS MIN TYP MAX UNITS Drain to Source Breakdown Voltage BVDSS ID = 250µA, VGS = 0V 60 - - V Gate Threshold Voltage VGS(TH) VGS = VDS, ID = 250µA1 - 3 V Zero Gate Voltage Drain Current IDSS VDS = 55V, VGS = 0V - - 1 µA VDS = 50V, VGS = 0V, TC = 150 oC - - 250 µA Gate to Source Leakage Current IGSS VGS = ±16V - - ±100 nA Drain to Source On Resistance (Note 2) rDS(ON) ID = 8A, VGS = 5V (Figure 11) - - 0.107 Ω Turn-On Time tON VDD ≈ 30V, ID = 8A, VGS = 4.5V, RGS = 32Ω (Figures 10, 18, 19) - - 170 ns Turn-On Delay Time td(ON) -8 - ns Rise Time tr - 105 - ns Turn-Off Delay Time td(OFF) -22 - ns Fall Time tf -39 - ns Turn-Off Time tOFF - - 92 ns Total Gate Charge Qg(TOT) VGS = 0V to 10V VDD = 30V, ID = 8A, Ig(REF) = 1.0mA (Figures 20, 21) - 9.4 11.3 nC Gate Charge at 5V Qg(5) VGS = 0V to 5V - 5.2 6.2 nC Threshold Gate Charge Qg(TH) VGS = 0V to 1V - 0.36 0.43 nC Input Capacitance CISS VDS = 25V, VGS = 0V, f = 1MHz (Figure 14) - 350 - pF Output Capacitance COSS - 105 - pF Reverse Transfer Capacitance CRSS -23 - pF Thermal Resistance Junction to Case RθJC - - 3.94 oC/W Thermal Resistance Junction to Ambient RθJA TO-220AB - - 62 oC/W TO-251AA, TO-252AA - - 100 oC/W Source to Drain Diode Specifications PARAMETER SYMBOL TEST CONDITIONS MIN TYP MAX UNITS Source to Drain Diode Voltage VSD ISD = 8A - 1.25 V Diode Reverse Recovery Time trr ISD = 8A, dISD/dt = 100A/µs - 66 ns NOTES: 2. Pulse Test: Pulse Width ≤ 300ms, Duty Cycle ≤ 2%. 3. Repetitive Rating: Pulse Width limited by max junction temperature. See Transient Thermal Impedance Curve (Figure 3) and Peak Current Capability Curve (Figure 5). RFD3055LE, RFD3055LESM, RFP3055LE |
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