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SN74LV1T04DBVR Datasheet(PDF) 2 Page - Texas Instruments |
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SN74LV1T04DBVR Datasheet(HTML) 2 Page - Texas Instruments |
2 / 16 page A Y 2 4 SN74LV1T04 SCLS738A – SEPTEMBER 2013 – REVISED SEPTEMBER 2013 www.ti.com This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications. FUNCTION TABLE INPUT OUTPUT (Lower Level Input) (VCC CMOS) A Y H L L H SUPPLY VCC = 3.3V A Y VIH(min) =1.35 V VOH(min) = 2.9 V VIL(max) =0.8 V VOL(max)= 0.2 V Figure 1. Logic Diagram (NAND Gate) Figure 2. Excellent Signal Integrity (1.8V to 3.3V at 3.3V VCC) 2 Submit Documentation Feedback Copyright © 2013, Texas Instruments Incorporated Product Folder Links :SN74LV1T04 |
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