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APW7073KE-TRG Datasheet(PDF) 2 Page - Anpec Electronics Coropration |
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APW7073KE-TRG Datasheet(HTML) 2 Page - Anpec Electronics Coropration |
2 / 20 page Copyright © ANPEC Electronics Corp. Rev. A.7 - Nov., 2012 APW7073 www.anpec.com.tw 2 Pin Configuration Absolute Maximum Ratings (Note 1) Symbol Parameter Rating Unit VCC, VPVCC VCC, PVCC to GND -0.3 to +16 V VBOOT BOOT to PHASE -0.3 to +16 V VUGATE UGATE to PHASE <400ns pulse width >400ns pulse width -5 to VBOOT +5 -0.3 to VBOOT +0.3 V VLGATE LGATE to PGND <400ns pulse width >400ns pulse width -5 to VPVCC +5 -0.3 to VPVCC +0.3 V VPHASE PHASE to GND <400ns pulse width >400ns pulse width -10 to +30 -0.3 to 16 V VRT, VOCSET, VEN RT, OCSET, EN to GND -0.3 to VCC+0.3 V VFB, VCOMP, VSS FB, COMP, SS to GND -0.3 to 7 V VPGND PGND to GND -0.3 to +0.3 V TJ Junction Temperature Range -20 to 150 °C TSTG Storage Temperature -65 to 150 °C TSDR Maximum Lead Soldering Temperature, 10 Seconds 260 °C Symbol Parameter Typical Value Unit θ JA Junction-to-Ambient Thermal Resistance in Free Air SOP-14 160 oC/W Thermal Characteristics (Note 2) Symbol Parameter Rating Unit VCC, VPVCC IC Supply Voltage 10.8 to 13.2 V VIN Converter Input Voltage 2.2 to 13.2 V VOUT Converter Output Voltage 0.6 to 5 V IOUT Converter Output Current 0 to 30 A TA Ambient Temperature Range -20 to 70 °C TJ Junction Temperature Range -20 to 125 °C Recommended Operating Conditions GND 7 FB 5 OCSET 2 8 PHASE SS 3 EN 6 COMP 4 14 VCC 10 BOOT 13 PVCC 9 UGATE 12 LGATE 11 PGND RT 1 SOP-14 Note2: θ JA is measured with the component mounted on a high effective the thermal conductivity test board in free air. The exposed pad of package is soldered directly on the PCB. Note1: Stresses beyond those listed under "absolute maximum ratings" may cause permanent damage to the device. These are stress ratings only and functional operation of the device at these or any other conditions beyond those indicated under "recommended operating conditions" is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. |
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