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AD5390BSTZ-3 Datasheet(PDF) 7 Page - Analog Devices |
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AD5390BSTZ-3 Datasheet(HTML) 7 Page - Analog Devices |
7 / 40 page Data Sheet AD5381 Rev. D | Page 7 of 40 Parameter AD5381-31 Unit Test Conditions/Comments LOGIC OUTPUTS (BUSY, SDO) 3 VOL, Output Low Voltage 0.4 V max Sinking 200 µA VOH, Output High Voltage DVDD – 0.5 V min Sourcing 200 µA High Impedance Leakage Current ±1 µA max SDO only High Impedance Output Capacitance 5 pF typ SDO only LOGIC OUTPUT (SDA)3 VOL, Output Low Voltage 0.4 V max ISINK = 3 mA 0.6 V max ISINK = 6 mA Three-State Leakage Current ±1 µA max Three-State Output Capacitance 8 pF typ POWER REQUIREMENTS AVDD 2.7/3.6 V min/max DVDD 2.7/5.5 V min/max Power Supply Sensitivity3 ∆Midscale/∆ΑVDD –85 dB typ AIDD 0.375 mA/channel max Outputs unloaded, boost off; 0.25 mA/channel typ 0.475 mA/channel max Outputs unloaded, boost on; 0.325 mA/channel typ DIDD 1 mA max VIH = DVDD, VIL = DGND AIDD (Power-Down) 20 µA max Typically 100 nA DIDD (Power-Down) 20 µA max Typically 1 µA Power Dissipation 48 mW max Outputs unloaded, boost off, AVDD = DVDD = 3 V 1 AD5381-3 is calibrated using an external 1.25 V reference. Temperature range is –40°C to +85°C. 2 Accuracy guaranteed from VOUT = 10 mV to AVDD – 50 mV. 3 Guaranteed by characterization, not production tested. 4 Default on the AD5381-3 is 1.25 V. Programmable to 2.5 V via CR10 in the AD5381 control register; operating the AD5381-3 with a 2.5 V reference will lead to degraded accuracy specifications and limited input code range. AC CHARACTERISTICS1 AVDD = 4.5 V to 5.5 V or 2.7 V to 3.6 V; DVDD = 2.7 V to 5.5 V; AGND = DGND = 0 V. Table 4. Parameter All Unit Test Conditions/Comments DYNAMIC PERFORMANCE Output Voltage Settling Time 1/4 scale to 3/4 scale change settling to ±1 LSB 3 µs typ 8 µs max Slew Rate 2 1.5 V/µs typ Boost mode off, CR9 = 0 2.5 V/µs typ Boost mode on, CR9 = 1 Digital-to-Analog Glitch Energy 12 nV-s typ Glitch Impulse Peak Amplitude 15 mV typ DAC-to-DAC Crosstalk 1 nV-s typ See Terminology section Digital Crosstalk 0.8 nV-s typ Digital Feedthrough 0.1 nV-s typ Effect of input bus activity on DAC output under test Output Noise 0.1 Hz to 10 Hz 15 µV p-p typ External reference, midscale loaded to DAC 40 µV p-p typ Internal reference, midscale loaded to DAC Output Noise Spectral Density @ 1 kHz 150 nV/√Hz typ @ 10 kHz 100 nV/√Hz typ 1 Guaranteed by design and characterization, not production tested. 2 Slew rate can be programmed via the current boost control bit in the AD5381 control register. |
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