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ISO7141FCCDBQ Datasheet(PDF) 11 Page - Texas Instruments |
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ISO7141FCCDBQ Datasheet(HTML) 11 Page - Texas Instruments |
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11 / 22 page  IN OUT GND2 GND1 C NOTE A L S1 VCC1 VCC2 C = 0.1 F ±1% m C = 0.1 F ±1% m Pass/Fail Criterion – the output must remain stable. V or V OH OL VTEST VO OUT IN IN = 0 V (Devices without suffix F) IN = V (Devices with suffix F) CC NOTE A CL VI 0 V t fs fs high VO VI 2.7 V 50% VCC VCC VOL VOH fs low ISO7131CC, ISO7140CC, ISO7140FCC ISO7141CC, ISO7141FCC www.ti.com SLLSE83E – APRIL 2013 – REVISED SEPTEMBER 2013 PARAMETER MEASUREMENT INFORMATION (continued) A. CL = 15 pF and includes instrumentation and fixture capacitance within ±20%. Figure 3. Failsafe Delay-Time Test Circuit and Voltage Waveforms A. CL = 15pF and includes instrumentation and fixture capacitance within ±20%. Figure 4. Common-Mode Transient Immunity Test Circuit Copyright © 2013, Texas Instruments Incorporated Submit Documentation Feedback 11 Product Folder Links: ISO7131CC ISO7140CC ISO7140FCC ISO7141CC ISO7141FCC |
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