LY612568_13 datasheet(5/11 Pages) LYONTEK

Part #	LY612568

Description	5V 256K X 8 BIT HIGH SPEED CMOS SRAM

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Manufacturer	LYONTEK [Lyontek Inc.]

Direct Link	http://www.lyontek.com.tw

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LY612568

Rev. 1.0

5V 256K X 8 BIT HIGH SPEED CMOS SRAM

Lyontek Inc. reserves the rights to change the specifications and products without notice.

5F, No. 2, Industry E. Rd. IX, Science-Based Industrial Park, Hsinchu 300, Taiwan.

TEL: 886-3-6668838

FAX: 886-3-6668836

4

®

AC TEST CONDITIONS

Input Pulse Levels

0.2V to VCC -0.2V

Input Rise and Fall Times

3ns

Input and Output Timing Reference Levels

1.5V

Output Load

CL = 30pF + 1TTL, IOH/IOL = -8mA/16mA

AC ELECTRICAL CHARACTERISTICS

(1) READ CYCLE

PARAMETER

SYM.

LY612568-15

LY612568-20

LY612568-25

UNIT

MIN.

MAX.

MIN.

MAX.

MIN.

MAX.

Read Cycle Time

tRC

15

-

20

-

25

-

ns

Address Access Time

tAA

-

15

-

20

-

25

ns

Chip Enable Access Time

tACE

-

15

-

20

-

25

ns

Output Enable Access Time

tOE

-

7

-

8

-

9

ns

Chip Enable to Output in Low-Z

tCLZ*

4

-

4

-

4

-

ns

Output Enable to Output in Low-Z

tOLZ*

0

-

0

-

0

-

ns

Chip Disable to Output in High-Z

tCHZ*

-

7

-

8

-

9

ns

Output Disable to Output in High-Z

tOHZ*

-

7-

8-

9

ns

Output Hold from Address Change

tOH

3

-

3

-

3

-

ns

(2) WRITE CYCLE

PARAMETER

SYM.

LY612568-15

LY612568-20

LY612568-25

UNIT

MIN.

MAX.

MIN.

MAX.

MIN.

MAX.

Write Cycle Time

tWC

15

-

20

-

25

-

ns

Address Valid to End of Write

tAW

12

-

16

-

20

-

ns

Chip Enable to End of Write

tCW

12

-

16

-

20

-

ns

Address Set-up Time

tAS

0

-

0

-

0

-

ns

Write Pulse Width

tWP

10

-

11

-

12

-

ns

Write Recovery Time

tWR

0

-

0

-

0

-

ns

Data to Write Time Overlap

tDW

8

-

9

-

10

-

ns

Data Hold from End of Write Time

tDH

0

-

0

-

0

-

ns

Output Active from End of Write

tOW*

4

-

5

-

6

-

ns

Write to Output in High-Z

tWHZ*

-

8-9-

10

ns

*These parameters are guaranteed by device characterization, but not production tested.

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