3

III. Result of Reliability Stress for AOT2500L

Note A: The reliability data presents total of available generic data up to the published date.

IV. Reliability Evaluation

FIT rate (per billion): 3.27

MTTF = 34906 years

The presentation of FIT rate for the individual product reliability is restricted by the actual burn-in

sample size of the selected product (AOT2500L). Failure Rate Determination is based on JEDEC

Standard JESD 85. FIT means one failure per billion hours.

Failure Rate (FIT) = Chi

= 1.83 x 10

MTTF = 10

Chi²= Chi Squared Distribution, determined by the number of failures and confidence interval

N = Total Number of units from HTRB and HTGB tests

H = Duration of HTRB/HTGB testing

Af = Acceleration Factor from Test to Use Conditions (Ea = 0.7eV and Tuse = 55°C)

Acceleration Factor ratio list:

55 deg C

70 deg C

85 deg C

100 deg C

115 deg C

130 deg C

150 deg C

Af

259

87

32

13

5.64

2.59

1

Tj s = Stressed junction temperature in degree (Kelvin), K = C+273.16

Tj u =The use junction temperature in degree (Kelvin), K = C+273.16

Test Item

Test Condition

Time

Point

Lot

Attribution

Total

Sample size

Number

of

Failures

Reference

Standard

MSL

Precondition

168hr 85°c

/85%RH +3 cycle

reflow@260°c

-

12 lots

2541pcs

0

JESD22-

A113

HTGB

Temp = 150°c ,

Vgs=100% of

Vgsmax

168hrs

500 hrs

1000 hrs

2 lots

6 lots

616pcs

77 pcs / lot

0

JESD22-

A108

HTRB

Temp = 150°c ,

Vds=80% of

Vdsmax

168hrs

500 hrs

1000 hrs

2 lots

6 lots

616pcs

77 pcs / lot

0

JESD22-

A108

HAST

130°c , 85%RH,

33.3 psi, Vds =

80% of Vdsmax

96 hrs

9 lots

(Note A*)

693pcs

77 pcs / lot

0

JESD22-

A110

Pressure Pot

121°c , 29.7psi,

RH=100%

96 hrs

12 lots

(Note A*)

924pcs

77 pcs / lot

0

JESD22-

A102

Temperature

Cycle

-65°c to 150°c ,

air to air,

250 / 500

cycles

12 lots

(Note A*)

924pcs

77 pcs / lot

0

JESD22-

A104