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5962F9563002V9A Datasheet(PDF) 1 Page - List of Unclassifed Manufacturers |
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1 / 27 page  REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Add device type 02. Add appendix A for device type 02 only. Make editorial changes throughout. 97-04-09 R. MONNIN B Make change to 1.4, 30.2.1, IS(OFF) overvoltage and ID(OFF) overvoltage tests. - ro 97-09-12 R. MONNIN C Make change to boilerplate and add device class T for device type 02. - ro 98-12-02 R. MONNIN D Add level P to table I. Make change to 1.5 and glassivation as specified under APPENDIX A. - ro 99-04-22 R. MONNIN E Make change to enable delay waveform as specified on figure 6. - ro 00-04-14 R. MONNIN F Make changes to supply voltage and VREF to GND limits as specified under 1.3. Make clarification to paragraphs 4.4.4.2 and 4.4.4.3. - ro 04-06-25 R. MONNIN G Under 1.5, move footnote 3/ to the latch up parameter. Make correction to the RL value under the tON(A), tOFF(A) test as specified in table I. - ro 06-02-24 R. MONNIN H Add a junction temperature limit to paragraph 1.3 and make clarifications to the figure 3 logic diagram. - ro 09-06-17 J. RODENBECK J Add device type 03. Add paragraphs 2.2, 6.7, and Table IB. Under Table IIB, delete +IS(OFF), -IS(OFF), -ID(OFF), +ID(OFF), +ID(ON), -ID(ON) parameters. Under figure A-1, backside metallization, delete the word “none” and replace with “silicon”. Update boilerplate paragraph to current MIL-PRF-38535 requirements. - ro 11-01-26 C. SAFFLE K Add device types 04 and 05. Make changes to paragraphs 1.2.2, 1.3, 1.4, 1.5, 4.4.4.2, A.1.2.2, A.1.2.4, Table IA, Table IB, Table IIA, Table IIB, and figure 1. Delete paragraph 4.4.4.2.1. - ro 11-06-28 C. SAFFLE L Add case outline Z. Make change to paragraph 3.2.5. Delete figure 4 radiation exposure circuit. Delete device class M requirements. - ro 13-05-02 C. SAFFLE M Add device types 04 and 05 to Table IIB. Delete LDR, HDR, and EDLRS references from paragraphs 1.2.2 and A.1.2.2. - ro 13-07-03 C. SAFFLE N Add device type 05 to the Analog input overvoltage range (power on/off) parameter as specified under paragraph 1.3. - ro 13-08-20 C. SAFFLE REV SHEET REV N N N N N N N N N N N SHEET 15 16 17 18 19 20 21 22 23 24 25 REV STATUS REV N N N N N N N N N N N N N N OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 14 PMIC N/A PREPARED BY RAJESH PITHADIA DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 http://www.landandmaritime.dla.mil STANDARD MICROCIRCUIT DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE CHECKED BY RAJESH PITHADIA APPROVED BY MICHAEL FRYE MICROCIRCUIT, DIGITAL-LINEAR, RADIATION HARDENED, SINGLE 16-CHANNEL ANALOG MUX / DEMUX WITH OVERVOLTAGE PROTECTION, MONOLITHIC SILICON DRAWING APPROVAL DATE 95-08-23 AMSC N/A REVISION LEVEL N SIZE A CAGE CODE 67268 5962-95630 SHEET 1 OF 25 DSCC FORM 2233 APR 97 5962-E545-13 |
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