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FOD060L Datasheet(PDF) 4 Page - Fairchild Semiconductor |
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FOD060L Datasheet(HTML) 4 Page - Fairchild Semiconductor |
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4 / 19 page  ©2008 Fairchild Semiconductor Corporation www.fairchildsemi.com FOD060L, FOD260L Rev. 1.0.5 4 Transfer Characteristics (T A = -40°C to +85°C Unless otherwise specified. Typical value is measured at TA = 25°C and VCC = 3.3V) Isolation Characteristics (T A = -40°C to +85°C Unless otherwise specified. Typical value is measured at TA = 25°C and VCC = 3.3V) Notes 1. The VCC supply to each optoisolator must be bypassed by a 0.1µF capacitor or larger. This can be either a ceramic or solid tantalum capacitor with good high frequency characteristic and should be connected as close as possible to the package VCC and GND pins of each device. 2. Enable Input – No pull up resistor required as the device has an internal pull up resistor. 3. tPLH – Propagation delay is measured from the 3.75 mA level on the HIGH to LOW transition of the input current pulse to the 1.5V level on the LOW to HIGH transition of the output voltage pulse. 4. tPHL – Propagation delay is measured from the 3.75 mA level on the LOW to HIGH transition of the input current pulse to the 1.5V level on the HIGH to LOW transition of the output voltage pulse. 5. tPSK is the worst case difference between tPHL and tPLH for any devices at the stated test conditions. 6. tr – Rise time is measured from the 90% to the 10% levels on the LOW to HIGH transition of the output pulse. 7. tf – Fall time is measured from the 10% to the 90% levels on the HIGH to LOW transition of the output pulse. 8. tELH – Enable input propagation delay is measured from the 1.5V level on the HIGH to LOW transition of the input voltage pulse to the 1.5V level on the LOW to HIGH transition of the output voltage pulse. 9. tEHL – Enable input propagation delay is measured from the 1.5V level on the LOW to HIGH transition of the input voltage pulse to the 1.5V level on the HIGH to LOW transition of the output voltage pulse. 10. CMH – The maximum tolerable rate of rise of the common mode voltage to ensure the output will remain in the high state (i.e., VOUT > 2.0 V). Measured in volts per microsecond (V/µs). 11. CML – The maximum tolerable rate of fall of the common mode voltage to ensure the output will remain in the low output state (i.e., VOUT < 0.8 V). Measured in volts per microsecond (V/µs). 12. Device considered a two-terminal device: Pins 1, 2, 3 and 4 shorted together, and Pins 5, 6, 7 and 8 shorted together. Symbol DC Characteristics Test Conditions Min. Typ. Max. Unit IOH High Level Output Current IF = 250 µA, VCC = 3.3 V, VO = 3.3 V, VE = 2.0 V (Note 2) 0.01 50 µA VOL Low Level Output Voltage VCC = 3.3 V, IF = 5 mA, IOL = 13 mA, VE = 2.0 V (Note 2) 0.3 0.6 V IFT Input Threshold Current VCC = 3.3 V, VO = 0.6 V, IOL = 13 mA, VE = 2.0 V (Note 2) 15 mA Symbol Characteristics Test Conditions Min. Typ. Max. Unit II-O Input-Output Insulation Leakage Current Relative humidity = 45%, TA = 25°C, t = 5 s, VI-O = 3000 VDC (Note 12) 1.0 µA VISO Withstand Insulation Test Voltage FOD060L FOD260L IIO ≤ 2 µA, RH < 50%, TA = 25°C, t = 1 min.(Note 12) 3750 VRMS 5000 RI-O Resistance (Input to Output) VI-O = 500 V (Note 12) 1012 Ω CI-O Capacitance (Input to Output) f = 1 MHz (Note 12) 0.6 pF |
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