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AD9874-EB Datasheet(PDF) 5 Page - Analog Devices |
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AD9874-EB Datasheet(HTML) 5 Page - Analog Devices |
5 / 40 page REV. A AD9874 –5– CAUTION ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on the human body and test equipment and can discharge without detection. Although the AD9874 features proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance degradation or loss of functionality. ABSOLUTE MAXIMUM RATINGS * Parameter With Respect to Min Max Unit VDDF, VDDA, VDDC, VDDD, VDDH, GNDF, GNDA, GNDC, GNDD, GNDH, –0.3 +4.0 V VDDL, VDDI GNDL, GNDI, GNDS VDDF, VDDA, VDDC, VDDD, VDDH, VDDR, VDDA, VDDC, VDDD, VDDH, –4.0 +4.0 V VDDL, VDDI VDDL, VDDI VDDP, VDDQ GNDP, GNDQ –0.3 +6.0 V GNDF, GNDA, GNDC, GNDD, GNDH, GNDF, GNDA, GNDC, GNDD, GNDH, –0.3 +0.3 V GNDL, GNDI, GNDQ, GNDP, GNDS GNDL, GNDI, GNDQ, GNDP, GNDS MXOP, MXON, LOP, LON, IFIN, GNDI –0.3 VDDI + 0.3 V CXIF, CXVL, CXVM PC, PD, PE, CLKOUT, DOUTA, GNDH –0.3 VDDH + 0.3 V DOUTB, FS, SYNCB IF2N, IF2P, GCP, GCN GNDF –0.3 VDDF + 0.3 V VREFP, VREFN, RREF GNDA –0.3 VDDA + 0.3 V IOUTC GNDQ –0.3 VDDQ + 0.3 V IOUTL GNDP –0.3 VDDP + 0.3 V CLKP, CLKN GNDC –0.3 VDDC + 0.3 V FREF GNDL –0.3 VDDL + 0.3 V Junction Temperature 150 °C Storage Temperature –65 +150 °C Lead Temperature (10 sec) 300 °C *Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only; functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum ratings for extended periods may affect device reliability. ORDERING GUIDE Model Temperature Range Package Description Package Option AD9874ABST –40 °C to +85°C 48-Lead Thin Plastic Quad Flatpack (LQFP) ST-48 AD9874EB Evaluation Board EXPLANATION OF TEST LEVELS TEST LEVEL I. 100% production tested. II. 100% production tested at 25 °C and sample tested at specified temperatures. AC testing done on sample basis. III. Sample tested only. IV. Parameter is guaranteed by design and/or characterization testing. V. Parameter is a typical value only. VI. All devices are 100% production tested at 25 °C; min and max guaranteed by design and characterization for industrial temperature range. THERMAL CHARACTERISTICS Thermal Resistance 48-Lead LQFP JA = 76.2 °C/W JC = 17 °C/W |
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