TSL2562, TSL2563

LOW-VOLTAGE

LIGHT-TO-DIGITAL CONVERTER

TAOS066N − AUGUST 2010

5

The LUMENOLOGY

r Company

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Copyright

E 2010, TAOS Inc.

www.taosinc.com

NOTES: 2. Optical measurements are made using small-angle incident radiation from light-emitting diode optical sources. Visible 640 nm LEDs

and infrared 940 nm LEDs are used for final product testing for compatibility with high-volume production.

λp = 640 nm and spectral halfwidth Δλ½ = 17 nm.

λp = 940 nm and spectral halfwidth Δλ½ = 40 nm.

Scaling between integration times vary proportionally as follows: 11/322 = 0.034 (field value 00), 81/322 = 0.252 (field value 01),

and 322/322 = 1 (field value 10).

6. Full scale ADC count value is limited by the fact that there is a maximum of one count per two oscillator frequency periods and also

by a 2-count offset.

Full scale ADC count value = ((number of clock cycles)/2 − 2)

Field value 00: Full scale ADC count value = ((11

Field value 01: Full scale ADC count value = ((81

Field value 10: Full scale ADC count value = 65535, which is limited by 16 bit register. This full scale ADC count value is reached

7. Low gain mode has 16

8. The sensor Lux is calculated using the empirical formula shown on p. 22 of this data sheet based on measured Ch0 and Ch1 ADC

count values for the light source specified. Actual Lux is obtained with a commercial luxmeter. The range of the (sensor Lux) / (actual

Lux) ratio is estimated based on the variation of the 640 nm and 940 nm optical parameters. Devices are not 100% tested with

fluorescent or incandescent light sources.