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UCC28703DBVR Datasheet(PDF) 3 Page - Texas Instruments

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Part # UCC28703DBVR
Description  Constant-Voltage, Constant-Current Controller With Primary-Side Regulation
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Manufacturer  TI [Texas Instruments]
Direct Link  http://www.ti.com
Logo TI - Texas Instruments

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UCC28700, UCC28701
UCC28702, UCC28703
www.ti.com
SLUSB41 – JULY 2012
RECOMMENDED OPERATING CONDITIONS
over operating free-air temperature range (unless otherwise noted)
MIN
TYP
MAX
UNIT
VDD
Bias supply operating voltage
9
35
V
CVDD
VDD bypass capacitor
0.047
1
µF
RCBC
Cable-compensation resistance
10
k
Ω
IVS
VS pin current
−1
mA
TJ
Operating junction temperature
−20
125
°C
THERMAL INFORMATION
UCC28700/1/2/3
THERMAL METRIC(1)
DBV
UNITS
6 PINS
θJA
Junction-to-ambient thermal resistance(2)
180.0
θJCtop
Junction-to-case (top) thermal resistance(3)
71.2
θJB
Junction-to-board thermal resistance(4)
44.4
°C/W
ψJT
Junction-to-top characterization parameter(5)
5.1
ψJB
Junction-to-board characterization parameter(6)
43.8
(1)
For more information about traditional and new thermal metrics, see the IC Package Thermal Metrics application report, SPRA953.
(2)
The junction-to-ambient thermal resistance under natural convection is obtained in a simulation on a JEDEC-standard, high-K board, as
specified in JESD51-7, in an environment described in JESD51-2a.
(3)
The junction-to-case (top) thermal resistance is obtained by simulating a cold plate test on the package top. No specific JEDEC-
standard test exists, but a close description can be found in the ANSI SEMI standard G30-88.
(4)
The junction-to-board thermal resistance is obtained by simulating in an environment with a ring cold plate fixture to control the PCB
temperature, as described in JESD51-8.
(5)
The junction-to-top characterization parameter,
ψJT, estimates the junction temperature of a device in a real system and is extracted
from the simulation data for obtaining
θJA, using a procedure described in JESD51-2a (sections 6 and 7).
(6)
The junction-to-board characterization parameter,
ψJB, estimates the junction temperature of a device in a real system and is extracted
from the simulation data for obtaining
θJA , using a procedure described in JESD51-2a (sections 6 and 7).
Copyright © 2012, Texas Instruments Incorporated
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Product Folder Link(s): UCC28700, UCC28701 UCC28702, UCC28703


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