No.

Item

Specifications

Test Method

Temperature

Compensating Type

See the previous page.

Within the specified dimensions

No defects or abnormalities

More than 10,000M

Ω or 500Ω • F (Whichever is smaller)

Within the specified tolerance

(Table A)

30pFmin. : Q

U1000

30pFmax. : Q

U400+20C

C : Nominal Capacitance (pF)

Within the specified tolerance

No defects or abnormalities

Y55 to W125D

Operating

Temperature

Rated Voltage

Appearance

Dimensions

Dielectric Strength

Insulation

Resistance

Capacitance

Q/

Dissipation Factor

(D.F.)

Capacitance

Temperature

Characteristics

1

2

3

4

5

6

7

8

9

Using calipers on micrometer

The insulation resistance should be measured with a DC

voltage not exceeding the rated voltage at 25

D and 75%RH

max. and within 2 minutes of charging.

The capacitance/Q/D.F. should be measured at 25

D at the

frequency and voltage shown in the table.

(2) High Dielectric Constant Type

The ranges of capacitance change compared with the above

25

D value over the temperature ranges shown in the table

should be within the specified ranges.

The capacitance change should be measured after 5 min. at

each specified temperature stage.

(1) Temperature Compensating Type

The temperature coefficient is determined using the

Capacitance measured in step 3 as a reference.

When cycling the temperature sequentially from step 1 through

5 (C0

∆ : W25D to W125D : other temp. coeffs. : W25D to

W85D) the capacitance should be within the specified tolerance

for the temperature coefficient and capacitance change as

Table A.

The capacitance drift is calculated by dividing the differences

between the maximum and minimum measured values in steps

1, 3 and 5 by the capacitance value in step 3.

(C0

Z5U and Y5V) is applied between the terminations for 1 to 5

seconds, provided the charge/discharge current is less than

Visual inspection

The rated voltage is defined as the maximum voltage which

may be applied continuously to the capacitor.

whichever is larger, should be maintained within the rated

voltage range.

High Dielectric Type

R6 :

Y55 to W85D

R7 :

Y55 to W125D

E4 :

W10 to W85D

F5 :

Y30 to W85D

[R6, R7]

W.V. : 25Vmin. : 0.025max.

W.V. : 16/10V : 0.035max.

W.V. : 6.3V

0.05max.(C

F3.3µF)

0.1max.(C

U3.3µF)

[E4]

W.V. : 25Vmin. : 0.025max.

[F5]

W.V. : 25Vmin.

: 0.05max.(C

F0.10µF)

: 0.09max.(C

U0.10µF)

W.V. : 16V/10V : 0.125max.

W.V. : 6.3Vmax. : 0.15max.

R6 : Within

T15%

(

Y55 to W85D)

R7 : Within±15%

(

Y55 to W125D)

E4 : Within

W22/Y56%

(

W10 to W85D)

F5 : Within

W22/Y82%

(

Y30 to W85D)

Capacitance

Change

Temperature

Coefficient

Item

∆C to 7U, 1X

(1000pF and

below)

1

T0.1MHz

0.5 to 5Vrms

Frequency

Voltage

∆C to 7U, 1X

(more than

1000pF)

1

T0.1kHz

1

T0.2Vrms

Char.

R6, R7, F5

(10µF and below)

1

T0.1kHz

1

T0.2Vrms

R6, R7, F5

(more than 10µF)

120

T24Hz

0.5

T0.1Vrms

E4

1

T0.1kHz

0.5

T0.05Vrms

Step

1

25

T2

Temperature(

D)

2

Y55T3 (for ∆C to 7U/1X/R6/R7)

Y30T3 (for F5)

10

T3 (for E4)

3

25

T2

4

125

T3 (for ∆C/R7)

85

T3 (for other TC)

5

25

T2

Capacitance

Drift

Within the specified tolerance

(Table A)

Within

T0.2% or T0.05pF

(Whichever is larger.)

*Does not apply to 1X/25V

Continued on the following page.

GRM Series Specifications and Test Methods

22

4

• This catalog has only typical specifications because there is no space for detailed specifications. Therefore, please approve our product specifications or transact the approval sheet for product specifications before ordering.

Please read rating and !CAUTION (for storage, operating, rating, soldering, mounting and handling) in this PDF catalog to prevent smoking and/or burning, etc.

This catalog has only typical specifications. Therefore, you are requested to approve our product specifications or to transact the approval sheet for product specificaions before ordering.

!Note

C02E10.pdf 04.1.20