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BQ771602DPJT Datasheet(PDF) 11 Page - Texas Instruments |
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BQ771602DPJT Datasheet(HTML) 11 Page - Texas Instruments |
11 / 20 page V(OUT) V(VCELL) OV Condition ≤ 170 ms V(CD) CD pin held low bq771600, bq771601, bq771602, bq771604 www.ti.com SLUSAX0A – DECEMBER 2012 – REVISED SEPTEMBER 2013 CUSTOMER TEST MODE It is possible to reduce test time for checking the overvoltage function by simply shorting the external CD capacitor to VSS. In this case, the OV delay would be reduced to the t(CHGDELAY) value, which has a maximum of 170 ms. CAUTION Avoid exceeding any Absolute Maximum Voltages on any pins when placing the part into Customer Test Mode. Also avoid exceeding Absolute Maximum Voltages for the individual cell voltages (V4–V3), (V3–V2), (V2–V1), and (V1–VSS). Stressing the pins beyond the rated limits may cause permanent damage to the device. Figure 13 shows the timing for the Customer Test Mode. Figure 13. Timing for Customer Test Mode Copyright © 2012–2013, Texas Instruments Incorporated Submit Documentation Feedback 11 Product Folder Links: bq771600 bq771601 bq771602 bq771604 |
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