TID Test Report

IRUH33P253B1M

September 2005, Rev 1

205 Crawford St, Leominster, Ma 01453

Tel: 976-534-5776

www.irf.com

4

INTRODUCTION

This test report covers the total ionizing dose tests performed on the IRUH33P253B1M Ultra Low

Dropout linear regulator in a hermetic package. The total ionizing dose test was performed on ten

samples of the device from production lot 318855, which had completed MIL-PRF-38534 “K” level

assembly, screening and Group A testing May 20, 2004. On September 2

Rectifier tested this device for total ionizing dose hardness at the University of Massachusetts,

Nuclear Research Facility using their CO

SUMMARY OF RESULTS

All of the test samples passed the post radiation test requirements for total ionizing dose levels up

to 750K RAD(Si). The results show a significant degradation in the “OFF” biased samples above

750K RAD(Si) but the devices all passed the post radiation test requirements after a 168hr room

temperature anneal. The “ON” biased samples passed the post radiation test requirements for all

of the required dose levels.

TEST METHOD

The test method used as a guide in the development of the Test Plan was MIL-STD-883, Method

1019 Ionizing Radiation, Condition A. This method establishes the basic requirements for the

performance and execution of the tests.

TEST PLAN

The samples were exposed to CO

requirements of the test plan and the radiation test specification. Post radiation testing of the

devices occurred at the UMass facility after each dose step was complete. The devices were

tested on September 2

devices were then placed on an extended room temperature anneal for 168hrs.

ON Biased serial numbers: 1677, 1678, 1689, 1693, and 1771

OFF Biased serial numbers: 1676, 1683, 1749, 1759, and 1762

Control Samples: 1703 and 1730. 1703 used for this test.

The Radiation Test Specification is included in Appendix B. The testing occurred in the following

manner:

1.0

Purpose

The purpose of this test is to characterize and qualify the Total Ionizing Dose effects for International

Rectifier’s hybrid ultra low dropout regulator devices. The data resulting from the tests may be incorporated

in the IR data sheet for the product.

2.0

Test Responsibility

International Rectifier shall be responsible for conducting the tests, which shall be performed at the

University of Massachusetts Research Reactor facility. International Rectifier shall be responsible for the final

Test Report.