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S-SERIES

(28V Input, Single/Dual Output)

1.

Parameter is tested as part of design characterization or after design changes. Thereafter, parameter

shall be guaranteed to the limits specified.

2.

Parameter verified during line and load regulation tests.

3.

Output load current must be distributed such that at least 20% of the total load current is being provided by

one of the outputs.

4.

Load currents split equally between outputs on dual output models. For dual output models, the output may

not meet regulation limits but the converter will not be damaged under this condition.

5.

Cross regulation is measured with 20% rated load on output under test while changing the load on the

other output from 20% to 80% of rated.

6.

Guaranteed for a D.C. to 20MHz bandwidth. Tested using a 20KHz to 10MHz bandwidth.

7.

Capacitive load may be any value from 0 to the maximum limit without compromising dc performance. A

capacitive load in excess of the maximum limit may interfere with the proper operation of the converter’s

overload protection, causing erratic behavior during turn-on.

8.

90% of nominal.

9.

Load step transition time

≥ 10 µs.

its steady state value.

11. Line step transition time

≥ 100 µs.

12. Turn-on delay time from either a step application of input power or a logic low to a logic high transition on

13. Current limit point expressed as a percentage of full rated load current.

14. Total Regulation includes all combinations of line and load compared to the nominal output voltage. For dual

models all line, load, and cross regulation conditions are tested per Note 4 and Note 5.

Notes: Electrical Performance Characteristics

Radiation Performance Characteristics

International Rectifier currently does not have a DLA Land and Maritime certified Radiation Hardness

Assurance Program.

Test

Conditions

Min

Typ

Unit

MIL-PRF-883, Method 1019.5

Total Ionizing Dose (Gamma)

Operating bias applied during exposure,

100

Krads(Si)

Heavy Ions (LET)

Single Event Effects

Operating bias applied during exposure,

SEU, SEL, SEGR, SEB

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Test lab: Cyclotron Institute,

Texas A & M University